New capabilities of the FLUKA multi-purpose code
C Ahdida, D Bozzato, D Calzolari, F Cerutti… - Frontiers in …, 2022 - frontiersin.org
FLUKA is a general purpose Monte Carlo code able to describe the transport and interaction
of any particle and nucleus type in complex geometries over an energy range extending …
of any particle and nucleus type in complex geometries over an energy range extending …
Total ionizing dose effects in MOS and low-dose-rate-sensitive linear-bipolar devices
DM Fleetwood - IEEE Transactions on Nuclear Science, 2013 - ieeexplore.ieee.org
An overview is presented of total ionizing dose (TID) effects in MOS and bipolar devices from
a historical perspective, focusing primarily on work presented at the annual IEEE Nuclear …
a historical perspective, focusing primarily on work presented at the annual IEEE Nuclear …
[图书][B] Single event effects in aerospace
E Petersen - 2011 - books.google.com
This book introduces the basic concepts necessary to understand Single Event phenomena
which could cause random performance errors and catastrophic failures to electronics …
which could cause random performance errors and catastrophic failures to electronics …
Monte Carlo simulation of single event effects
In this paper, we describe a Monte Carlo approach for estimating the frequency and
character of single event effects based on a combination of physical modeling of discrete …
character of single event effects based on a combination of physical modeling of discrete …
Modeling of single event transients with dual double-exponential current sources: Implications for logic cell characterization
DA Black, WH Robinson, IZ Wilcox… - … on Nuclear Science, 2015 - ieeexplore.ieee.org
Single event effects (SEE) are a reliability concern for modern microelectronics. Bit
corruptions can be caused by single event upsets (SEUs) in the storage cells or by sampling …
corruptions can be caused by single event upsets (SEUs) in the storage cells or by sampling …
Fault simulation and emulation tools to augment radiation-hardness assurance testing
HM Quinn, DA Black, WH Robinson… - IEEE Transactions on …, 2013 - ieeexplore.ieee.org
As of 2013, the gold standard for assessing radiation-hardness assurance (RHA) for a
system, subsystem, or a component is accelerated radiation testing and/or pulsed laser …
system, subsystem, or a component is accelerated radiation testing and/or pulsed laser …
Modeling single event transients in advanced devices and ICs
The ability for Single Event Transients (SETs) to induce soft errors in Integrated Circuits (ICs)
was predicted for the first time by Wallmark and Marcus in the early 60's and was confirmed …
was predicted for the first time by Wallmark and Marcus in the early 60's and was confirmed …
Multi-scale, Multi-physics Modeling and Simulation of Single Event Effects in Digital Electronics: from Particles to Systems
JL Autran, D Munteanu - IEEE Transactions on Nuclear Science, 2023 - ieeexplore.ieee.org
This article aims to provide a survey of modeling and simulation of single-event effects
(SEEs) in digital electronics at device, circuit, and system levels. It primarily focuses on the …
(SEEs) in digital electronics at device, circuit, and system levels. It primarily focuses on the …
Impact of the radial ionization profile on SEE prediction for SOI transistors and SRAMs beyond the 32-nm technological node
The relative contribution of the radial ionization profile on SEE prediction is investigated
using MUSCA-SEP 3, in comparison with the classical approach considering the ion track as …
using MUSCA-SEP 3, in comparison with the classical approach considering the ion track as …
Anthology of the development of radiation transport tools as applied to single event effects
This anthology contains contributions from eleven different groups, each developing and/or
applying Monte Carlo-based radiation transport tools to simulate a variety of effects that …
applying Monte Carlo-based radiation transport tools to simulate a variety of effects that …