Label‐free super‐resolution (LFSR) imaging relies on light‐scattering processes in
nanoscale objects without a need for fluorescent (FL) staining required in super‐resolved FL …

Whether intentionally introduced to exert control over particles and macroscopic objects,
such as for trapping or cooling, or whether arising from the quantum and thermal fluctuations …

The enhancement and confinement of electromagnetic radiation to nanometer scale have
improved the performances and decreased the dimensions of optical sources and detectors …

The ability to image the optical near-fields of nanoscale structures, map their morphology,
and concurrently obtain spectroscopic information, all with high spatiotemporal resolution, is …

We demonstrate the application of Atomic Force Microscopy (AFM) for mapping optical near-
fields with nanometer resolution, limited only by the AFM probe geometry. By detecting the …

Many important applications of nanometer-scale metallic complexes arise from the light-
induced, near-field interactions between their component structures. Here we examine the …

Azimuthally polarized beams are gaining fundamental importance for near-field force
microscopy systems to inspect photoinduced magnetism in special molecules or …

The optical gradient force provides optomechanical interactions, for particle trapping and
manipulation, as well as for near-field optical imaging in scanning probe microscopy. Based …

Modern nanotechnology demands advanced microscopy with ever finer resolution and
detectivity of both explicit and inexplicit features of matter. While typical optical microscopy …

The near‐field features of graphene plasmons (GPs) using a recently developed photo‐
induced force microscopy (PiFM) technique are characterized here. The GPs are excited by …