Contact mode is a versatile and widely used technique for imaging samples using the
Atomic Force Microscope (AFM). When contact mode imaging is performed in constant …

The maneuvering and electrical characterization of nanotubes inside a scanning electron
microscope (SEM) has historically been time-consuming and laborious for operators. Before …

This article proposes a two-finger-based micrograsping system with high compliant
borosilicate 3.3 glass probes and the corresponding sensing and control algorithms, which …

Nanoplastic particles (NPs) are ubiquitously present in the environment and their potentially
harmful effects on ecological systems remain largely unknown. Owing to their minute spatial …

Adhesion assessment of nanoscale contacts is a critical capability for the development of
future nanoelectromechanical systems and nanobiotechnology devices. However …

Future assembly technologies will involve higher levels of automation in order to satisfy
increased microscale or nanoscale precision requirements. Traditionally, assembly using a …

Defocus and astigmatism can lead to blurred images and poor resolution. This paper
presents a simplified method for focusing and astigmatism correction of a scanning electron …

Path following control of micrometer-sized tools is the key to improve automation capabilities
at the small scales. This paper addresses the issue of path following control for piezoelectric …

Scanning Electron Microscopy (SEM) is an ideal observation tool for small scales robotics. It
has the potential to achieve automated nano-robotic tasks such as nano-handling and nano …

Electron microscopy allows for resolving of structure sizes far below the resolution limit of
optical microscopes and is therefore increasingly applied as an in-situ imaging method …