The continuous advancement of complementary metal-oxide-semiconductor technologies
makes flip-flops (FFs) vulnerable to soft errors. Single-node upsets (SNUs), as well as …

This paper discusses principles and techniques to evaluate processors for dependable
computing in space applications. The focus is on soft errors, which dominate the failure rate …

There is an invisible enemy that constantly threatens the operation of electronics: ionizing
radiation. From sea level to outer space, ionizing radiation is virtually everywhere. At sea …

Soft error originating from cosmic ray is a serious concern for reliability demanding
applications, such as autonomous driving, supercomputer, and public transportation system …

This paper presents two novel memory cell designs that can completely tolerate double-
node upsets. First, a layout dependent cell is proposed. Since the cell has many redundant …

Radiation-induced multiple event transients (METs) are expected to become more frequent
than single event transients (SETs) at nanoscale CMOS technology nodes. In this paper, a …

With the emerging nanoscale CMOS technology, Multiple Event Transients (METs)
originated from radiation strikes are expected to become more frequent than Single Event …

For the safety-critical applications such as biomedical and automobile electronics, the
system failure induced by soft errors becomes a major issue of reliability. However, most of …

In this paper, we propose a novel hardened latch to mitigate the SEU. The combination of
the circuit structure and layout placement is adopted to enhance the multiple nodes upset …

We measure neutron-induced Single Event Upsets (SEUs) and Multiple Cell Upsets (MCUs)
on Flip-Flops (FFs) in a 65-nm bulk CMOS process in order to evaluate dependence of …