Built-in self-test (BIST) methods for MEMS: A review

G Hantos, D Flynn, MPY Desmulliez - Micromachines, 2020 - mdpi.com
A novel taxonomy of built-in self-test (BIST) methods is presented for the testing of micro-
electro-mechanical systems (MEMS). With MEMS testing representing 50% of the total costs …

Novel adaptive FPGA-based self-calibration and self-testing scheme with PN sequences for MEMS-based inertial sensors

A Kansal, EH Sarraf, M Sharma… - 2011 IEEE 17th …, 2011 - ieeexplore.ieee.org
We propose a novel adaptive technique based on pseudo-random (PN) sequences for self-
calibration and self-testing of capacitive-based sensing and resonator microstructures, using …

Self-monitoring, self-healing biomorphic sensor technology

A Richardson, D Cheneler - … on On-Line Testing and Robust …, 2019 - ieeexplore.ieee.org
The deployment of autonomous sensors within electronic systems for both existing and
emerging markets requires an increase in the reliability, security and dependability of the …

FPGA-based novel adaptive scheme using PN sequences for self-calibration and self-testing of MEMS-based inertial sensors

EH Sarraf, A Kansal, M Sharma, E Cretu - Journal of Electronic Testing, 2012 - Springer
We propose a novel adaptive technique based on pseudo-random (PN) sequences for self-
calibration and self-testing of MEMS-based inertial sensors (accelerometers and …

Comparator based self-trim and self-test scheme for arbitrary analogue on-chip values

HM von Staudt - 2010 IEEE 16th International Mixed-Signals …, 2010 - ieeexplore.ieee.org
Trimming is a ubiquitous element of many mixed-signal circuits. Already a long standing
requirement of mixed-signal design trimming is made even more popular by shrinking …

Simple IP subnet VLAN implementation

CW Kok, MS Beg - Proceedings. Ninth IEEE International …, 2001 - ieeexplore.ieee.org
This paper describes a simple method of implementing an IP subnet VLAN. Normally,
switches have to exchange VLAN membership information with its neighboring switches via …

Zuverlässigkeit von Mikro-und Nanosystemen

TMI Băjenescu, TMI Băjenescu - Zuverlässige Bauelemente für …, 2020 - Springer
Ein typisches Mikrosystem enthält auf einem einzigen Chip, einen Mikrosensor, ein
Mikrostellglied (eine mechanische Komponente) und die notwendige–integrierte–Elektronik …

[PDF][PDF] Built-In Self-Test (BIST) Methods for MEMS: A Review. Micromachines 2021, 12, 40

G Hantos, D Flynn, MPY Desmulliez - 2020 - pdfs.semanticscholar.org
A novel taxonomy of built-in self-test (BIST) methods is presented for the testing of
microelectro-mechanical systems (MEMS). With MEMS testing representing 50% of the total …

Fab-in-the-Loop Verification Method using On-Chip Virtual Clock Management Unit and Built-in Test Vector Generation Unit for Fast IC-level Test of Sensor-integrated …

D Park, J Cho - International Information Institute (Tokyo) …, 2015 - search.proquest.com
Fast test environment for the sensor-based embedded system, which is integrated on the
system-on-chip (SoC), is proposed by adopting fab-in-the-loop verification methodology …