Plasma-assisted atomic layer deposition: basics, opportunities, and challenges

HB Profijt, SE Potts, MCM Van de Sanden… - Journal of Vacuum …, 2011 - pubs.aip.org
Plasma-assisted atomic layer deposition (ALD) is an energy-enhanced method for the
synthesis of ultra-thin films with Å-level resolution in which a plasma is employed during one …

Atomic layer deposition of Y2O3 and yttrium-doped HfO2 using a newly synthesized Y (iPrCp) 2 (N-iPr-amd) precursor for a high permittivity gate dielectric

JS Lee, WH Kim, IK Oh, MK Kim, G Lee, CW Lee… - Applied surface …, 2014 - Elsevier
We systematically investigated the effects of Y doping in HfO 2 dielectric layer, focusing on
structural phase transformation and the dielectric properties of the resultant films. Y doping …

Controlling the crystallinity of HfO2 thin film using the surface energy-driven phase stabilization and template effect

AJ Lee, BS Kim, JH Hwang, Y Kim, H Oh, YJ Park… - Applied Surface …, 2022 - Elsevier
Phase transition of HfO 2 thin film has been investigated to demonstrate desirable electrical
properties, such as high dielectric constant or ferroelectricity, however, the most of results …

Atomic layer deposition of B 2 O 3/SiO 2 thin films and their application in an efficient diffusion doping process

WH Kim, IK Oh, MK Kim, WJ Maeng, CW Lee… - Journal of Materials …, 2014 - pubs.rsc.org
We investigated atomic layer deposition (ALD) of B2O3 and SiO2 thin films using
trimethylborate (TMB) and bis-(diethylamino) silane (SAM-24) precursors, focusing on …

Characterization of radical-enhanced atomic layer deposition process based on microwave surface wave generated plasma

D Tvarog, J Olejníček, J Kratochvíl, P Kšírová… - Journal of Applied …, 2021 - pubs.aip.org
ABSTRACT A plasma-assisted atomic layer deposition system employing a microwave
surfatron plasma was developed and characterized by spatially resolved Langmuir probe …

Low temperature atomic layer deposited Al-doped ZnO thin films and associated semiconducting properties

WJ Maeng, SJ Kim, JS Park, KB Chung… - Journal of Vacuum …, 2012 - pubs.aip.org
Semiconducting Al-doped ZnO films were deposited by atomic layer deposition at low
deposition temperatures of less than 100 C and used to fabricate transistors. At deposition …

MOS Capacitance Measurements for PEALD TiO2 Dielectric Films Grown under Different Conditions and the Impact of Al2O3 Partial-Monolayer Insertion

W Chiappim, M Watanabe, V Dias, G Testoni, R Rangel… - Nanomaterials, 2020 - mdpi.com
In this paper, we report the plasma-enhanced atomic layer deposition (PEALD) of TiO2 and
TiO2/Al2O3 nanolaminate films on p-Si (100) to fabricate metal-oxide-semiconductor (MOS) …

Significant Enhancement of the Dielectric Constant through the Doping of CeO2 into HfO2 by Atomic Layer Deposition

WH Kim, MK Kim, IK Oh, WJ Maeng… - Journal of the …, 2014 - Wiley Online Library
Films of CeO 2 were deposited by atomic layer deposition (ALD) using a Ce (mmp) 4 [mmp=
1‐methoxy‐2‐methyl‐2‐propanolate] precursor and H2O reactant. The growth …

Band alignment at the SiO/HfO interface: Group IIIA versus group IIIB metal dopants

X Luo, G Bersuker, AA Demkov - Physical Review B—Condensed Matter and …, 2011 - APS
Using density functional theory (DFT) we examine the effect of Al and La incorporation on
the electronic properties of the interface in the SiO 2/HfO 2 high-k gate stacks recently …

Interface engineering through atomic dopants in HfO2-based gate stacks

H Zhu, G Ramanath, R Ramprasad - Journal of Applied Physics, 2013 - pubs.aip.org
Controlling the effective work function (⁠ ϕ eff⁠) of metal electrodes is critical and
challenging in metal-oxide-semiconductor field effect transistors. The introduction of atomic …