Characterization of probe lasers for thin-film optical measurements
CC Kuo, CS Chao - Journal of Russian Laser Research, 2010 - Springer
The peak-power-density stability and beam-wander precision of a probe laser are important
factors affecting the inspection results in precise thin-film optical measurements. These …
factors affecting the inspection results in precise thin-film optical measurements. These …
[PDF][PDF] Time‐resolved reflectivity technique: improvement and applications
KMA El-Kader - International Journal of Photoenergy, 1999 - Wiley Online Library
A new method for determination of the reflectivity of Si in different phase transitions during
pulsed laser irradiation is presented in this paper. This method is applied on TRR spectra of …
pulsed laser irradiation is presented in this paper. This method is applied on TRR spectra of …
Air optical breakdown on silicon as a novel method to fabricate photoluminescent Si-based nanostructures
AV Kabashin, M Meunier - Nanoscience Using Laser-Solid …, 2002 - spiedigitallibrary.org
A novel dry, vacuum-free laser-assisted method for a fabrication of nanostructured Si/SiO x
layers on a silicon wafer is demonstrated. This method uses the phenomenon of air optical …
layers on a silicon wafer is demonstrated. This method uses the phenomenon of air optical …