Test of reconfigurable modules in scan networks
Modern devices often include several embedded instruments, such as BIST interfaces,
sensors, calibration facilities. New standards, such as IEEE Std 1687, provide vehicles to …
sensors, calibration facilities. New standards, such as IEEE Std 1687, provide vehicles to …
Structure-oriented test of reconfigurable scan networks
D Ull, M Kochte, HJ Wunderlich - 2017 IEEE 26th Asian Test …, 2017 - ieeexplore.ieee.org
Design, production and operation of modern system-on-chips rely on integrated instruments,
which range from simple sensors to complex debug interfaces and design-for-test (DfT) …
which range from simple sensors to complex debug interfaces and design-for-test (DfT) …
Post-silicon validation of ieee 1687 reconfigurable scan networks
The increasing number of embedded instruments used to perform test, monitoring,
calibration and debug within a semiconductor device has called for a brand new standard …
calibration and debug within a semiconductor device has called for a brand new standard …
Online periodic test of reconfigurable scan networks
Reconfigurable Scan Networks (RSNs) access embedded instruments throughout the whole
system lifecycle. To support dependability management by means of RSNs, RSNs …
system lifecycle. To support dependability management by means of RSNs, RSNs …
Testability-enhancing resynthesis of reconfigurable scan networks
Reconfigurable Scan Networks (RSNs) have to be tested before they can be used for post-
silicon validation, diagnosis or online reliability management. Even a single stuck-at fault in …
silicon validation, diagnosis or online reliability management. Even a single stuck-at fault in …
Concurrent test of reconfigurable scan networks for self-aware systems
Self-aware and safety-critical hardware/software systems rely on a variety of embedded
instruments, sensors, monitors and design-for-test circuitry to check the system integrity. The …
instruments, sensors, monitors and design-for-test circuitry to check the system integrity. The …
A Complete Design-for-Test Scheme for Reconfigurable Scan Networks
Abstract Reconfigurable Scan Networks (RSNs) are widely used for accessing instruments
offline during debug, test and validation, as well as for performing system-level-test and …
offline during debug, test and validation, as well as for performing system-level-test and …
Synthesis of fault-tolerant reconfigurable scan networks
S Brandhofer, MA Kochte… - … Design, Automation & …, 2020 - ieeexplore.ieee.org
On-chip instrumentation is mandatory for efficient bring-up, test and diagnosis, post-silicon
validation, as well as in-field calibration, maintenance, and fault tolerance. Reconfigurable …
validation, as well as in-field calibration, maintenance, and fault tolerance. Reconfigurable …
Simulation-based Equivalence Checking between IEEE 1687 ICL and RTL
A fundamental part of the new IEEE Std 1687 is the Instrument Connectivity Language (ICL),
which allows for abstract description of the scan network. The big novelty if compared to …
which allows for abstract description of the scan network. The big novelty if compared to …
Reconfigurable scan network defect diagnosis
GA Danialy, M Keim - US Patent 10,520,550, 2019 - Google Patents
The number of functional blocks in semiconductor devices continues to increase significantly
as the integration of functionality into a single semiconductor device continues. A functional …
as the integration of functionality into a single semiconductor device continues. A functional …