Diamond color centers with applications to single photon sources, quantum computation,
and magnetic field sensing down to the nanoscale have been investigated using ensembles …

The ion beam induced charge (IBIC) technique is a scanning microscopy technique which
uses finely focused MeV ion beams as probes to measure and image the transport …

We characterized intrinsic deep level defects created in ion collision cascades which were
produced by patterned implantation of single accelerated 2.0 MeV He and 600 keV H ions …

We report findings on the Ion Beam Induced Charge (IBIC) characterization of a 4H-SiC
Schottky barrier diode (SBD), in terms of the modification of the Charge Collection Efficiency …

The demonstration of universal quantum logic operations near the fault-tolerance threshold
has established ion-implanted near-surface donor atoms as a plausible platform for scalable …

New silicon 3-D-microdetectors have been developed to perform microdosimetry
measurements for applications in hadron therapy. In this work, the charge collection …

This paper investigates both theoretically and experimentally the charge collection efficiency
(CCE) degradation in silicon diodes induced by energetic ions. Ion Beam Induced Charge …

We demonstrate low energy single ion detection using a co-planar detector fabricated on a
diamond substrate and characterized by ion beam induced charge collection. Histograms …

In multi-electrode devices, charge pulses at all the electrodes are induced concurrently by
the motion of the excess charge carriers generated by a single ion. This charge-sharing …

Abstract Ion Beam Induced Charge (IBIC) microscopy performed using highly tuned
microbeams of accelerated ions with energies in the MeV range is the powerful tool for …