[图书][B] Electronic phenomena in adsorption and catalysis on semiconductors and dielectrics
VF Kiselev, OV Krylov, VF Kiselev - 1987 - Springer
It is now firmly established that various adsorptive and catalytic processes taking place on
the surface of semiconductors and in MIS structures strongly influence their electronic …
the surface of semiconductors and in MIS structures strongly influence their electronic …
Carbon and oxygen diffusion in calcite: Effects of Mn content and PH2O
AK Kronenberg, RA Yund, BJ Giletti - Physics and chemistry of minerals, 1984 - Springer
The diffusion rates of carbon and oxygen in two calcite crystals of different Mn contents have
been studied between 500° and 800° C in a CO 2-H 2 O atmosphere (P CO 2= 1− 5 bars …
been studied between 500° and 800° C in a CO 2-H 2 O atmosphere (P CO 2= 1− 5 bars …
Kinetic limitations to surface segregation during MBE growth of III–V compounds: Sn in GaAs
JJ Harris, DE Ashenford, CT Foxon, PJ Dobson… - Applied Physics A, 1984 - Springer
The incorporation of Sn as a dopant in GaAs has been studied in the temperature range of
500°–650° C, over a wide range of Ga and As fluxes, the latter being incident as either As 4 …
500°–650° C, over a wide range of Ga and As fluxes, the latter being incident as either As 4 …
Comparison of basic principles of the surface‐specific analytical methods: AES/SAM, ESCA (XPS), SIMS, and ISS with X‐ray microanalysis, and some applications in …
H Hantsche - Scanning, 1989 - Wiley Online Library
Modern analytical methods for the investigation of surfaces have been greatly improved
during the last decade, and the number of instruments offered by manufacturers has …
during the last decade, and the number of instruments offered by manufacturers has …
Auger electron spectroscopy and secondary ion mass spectrometry depth profiling with sample rotation
EH Cirlin - Thin Solid Films, 1992 - Elsevier
Recently, there has been a rapid increase in the application of multilayered structured
materials, as opposed to bulk materials, in many areas of technological development …
materials, as opposed to bulk materials, in many areas of technological development …
Stability of interfaces in solar energy materials
AW Czanderna - Solar Energy Materials, 1981 - Elsevier
This paper is a review of various methods for interface analysis and how they are or could
be used for studying the stability of interfaces in solar energy materials. First, a brief …
be used for studying the stability of interfaces in solar energy materials. First, a brief …
Non-equilibrium dopants incorporation in silicon melted by laser pulses
SU Campisano - Applied Physics A, 1983 - Springer
The rapid solidification of silicon layers melted by high-power laser pulses lead to an
enhanced incorporation of implanted dopants in substitutional lattice sites. A review of …
enhanced incorporation of implanted dopants in substitutional lattice sites. A review of …
The metal organic vapour phase epitaxy of ZnTe: III. Correlation of growth and layer properties
WS Kuhn, A Lusson, B Qu'Hen, C Grattepain… - Progress in crystal …, 1995 - Elsevier
The crystalline structure, surface morphology, optical properties and purity of ZnTe layers
grown by MOVPE were investigated. Various substrates, different combinations of …
grown by MOVPE were investigated. Various substrates, different combinations of …
Secondary ion mass spectrometry in geochemistry and cosmochemistry: determination and distribution of carbon and hydrogen in silicate samples
SN Shilobreeva - Journal of analytical chemistry, 2017 - Springer
Based on a review of recent domestic and international literature, examples of using
secondary ion mass spectrometry (SIMS) for the determination of carbon and hydrogen in …
secondary ion mass spectrometry (SIMS) for the determination of carbon and hydrogen in …
Secondary ion mass spectroscopy
CG Pantano - 1986 - dl.asminternational.org
In secondary ion mass spectroscopy (SIMS), an energetic beam of focused ions is directed
at the sample surface in a high or ultrahigh vacuum (UHV) environment. The transfer of …
at the sample surface in a high or ultrahigh vacuum (UHV) environment. The transfer of …