Displacement damage in silicon detectors for high energy physics

M Moll - IEEE Transactions on Nuclear Science, 2018 - ieeexplore.ieee.org
In this paper, we review the radiation damage issues caused by displacement damage in
silicon sensors operating in the harsh radiation environments of high energy physics …

Expression of Interest for a Phase-II LHCb Upgrade: Opportunities in flavour physics, and beyond, in the HL-LHC era

R Aaij, G Ciezarek, P Collins, S Roiser, A Vollhardt… - 2017 - cds.cern.ch
Abstract A Phase-II Upgrade is proposed for the LHCb experiment in order to take full
advantage of the flavourphysics opportunities at the HL-LHC, and other topics that can be …

SISSA: Acceptor removal-Displacement damage effects involving the shallow acceptor doping of p-type silicon devices

M Moll - PoS, 2020 - cds.cern.ch
New sensor technologies are under development to cope with the ever increasing
requirements for high energy physics (HEP) detectors. For the High-Luminosity LHC (HL …

Charge collection in irradiated HV-CMOS detectors

B Hiti, A Affolder, K Arndt, R Bates, M Benoit… - Nuclear Instruments and …, 2019 - Elsevier
Active silicon detectors built on p-type substrate are a promising technological solution for
large area silicon trackers such as those at the High Luminosity LHC, but the radiation …

Investigation of the Boron removal effect induced by 5.5 MeV electrons on highly doped EPI-and Cz-silicon

C Liao, E Fretwurst, E Garutti, J Schwandt… - Nuclear Instruments and …, 2023 - Elsevier
This study focuses on the properties of the B i O i (interstitial Boron–interstitial Oxygen) and
C i O i (interstitial Carbon–interstitial Oxygen) defect complexes by 5.5 MeV electrons in low …

Neutron irradiation test of depleted CMOS pixel detector prototypes

I Mandić, V Cindro, A Gorišek, B Hiti… - Journal of …, 2017 - iopscience.iop.org
Charge collection properties of depleted CMOS pixel detector prototypes produced on p-
type substrate of 2 kΩ cm initial resistivity (by LFoundry 150 nm process) were studied using …

Studies of irradiated AMS H35 CMOS detectors for the ATLAS tracker upgrade

E Cavallaro, R Casanova, F Förster… - Journal of …, 2017 - iopscience.iop.org
Silicon detectors based on the HV-CMOS technology are being investigated as possible
candidate for the outer layers of the ATLAS pixel detector for the High Luminosity LHC. In …

Testbeam results of irradiated ams H18 HV-CMOS pixel sensor prototypes

M Benoit, S Braccini, G Casse, H Chen… - Journal of …, 2018 - iopscience.iop.org
HV-CMOS pixel sensors are a promising option for the tracker upgrade of the ATLAS
experiment at the LHC, as well as for other future tracking applications in which large areas …

The Boron–Oxygen (BᵢOᵢ) Defect Complex Induced by Irradiation With 23 GeV Protons in p-Type Epitaxial Silicon Diodes

C Liao, E Fretwurst, E Garutti… - … on Nuclear Science, 2022 - ieeexplore.ieee.org
In this work, the thermally stimulated current (TSC) technique has been used to investigate
the properties of the radiation-induced interstitial boron and interstitial oxygen defect …

Reasons for high charge collection efficiency of silicon detectors at HL-LHC fluences

G Kramberger - Nuclear Instruments and Methods in Physics Research …, 2019 - Elsevier
Position sensitive silicon detectors are more resilient to radiation then predicted from
extensive measurements over the R&D phase for Large Hadron Collider. It was …