[HTML][HTML] Quantum dot-integrated GaN light-emitting diodes with resolution beyond the retinal limit

J Bae, Y Shin, H Yoo, Y Choi, J Lim, D Jeon… - Nature …, 2022 - nature.com
Near-eye display technology is a rapidly growing field owing to the recent emergence of
augmented and mixed reality. Ultrafast response time, high resolution, high luminance, and …

[图书][B] Heteroepitaxy of semiconductors: theory, growth, and characterization

JE Ayers, T Kujofsa, P Rago, J Raphael - 2016 - taylorfrancis.com
In the past ten years, heteroepitaxy has continued to increase in importance with the
explosive growth of the electronics industry and the development of a myriad of …

Stranski-Krastanov growth mode during the molecular beam epitaxy of highly strained GaN

B Daudin, F Widmann, G Feuillet, Y Samson, M Arlery… - Physical Review B, 1997 - APS
It is demonstrated by in situ reflection-high-energy-electron-diffraction studies that the growth
of hexagonal GaN on AlN occurs either purely in a layer-by-layer mode or in a Stranski …

From visible to white light emission by GaN quantum dots on Si (111) substrate

B Damilano, N Grandjean, F Semond, J Massies… - Applied physics …, 1999 - pubs.aip.org
GaN quantum dots (QDs) in an AlN matrix have been grown on Si (111) by molecular-beam
epitaxy. The growth of GaN deposited at 800° C on AlN has been investigated in situ by …

[图书][B] related Semiconductors

JH Edgar, S Strite, I Akasaki, H Amano, CWG Nitride - 1999 - mrlweb.mrl.ucsb.edu
Controlled introduction of impurities forms the basis of much of semiconductor technology;
indeed p-type (acceptor-doped) and n-type (donor-doped) layers and the junctions between …

In situ measurements of the critical thickness for strain relaxation in AlGaN∕ GaN heterostructures

SR Lee, DD Koleske, KC Cross, JA Floro… - Applied physics …, 2004 - pubs.aip.org
Using in situ wafer-curvature measurements of thin-film stress, we determine the critical
thickness for strain relaxation in Al x Ga 1− x N∕ Ga N heterostructures with 0.14⩽ x⩽ 1⁠ …

Strain relaxation in (0001) AlN/GaN heterostructures

A Bourret, C Adelmann, B Daudin, JL Rouvière… - Physical Review B, 2001 - APS
The strain-relaxation phenomena during the early stages of plasma-assisted molecular-
beam epitaxy growth of lattice-mismatched wurtzite (0001) AlN/GaN heterostructures have …

Film thickness and temperature dependence of the magnetic properties of pulsed-laser-deposited films on different substrates

S Kale, SM Bhagat, SE Lofland, T Scabarozi, SB Ogale… - Physical Review B, 2001 - APS
We report a systematic study of< 100> epitaxial films of magnetite (Fe 3 O 4) of thickness
300–2000 Å, grown on single-crystal substrates (MgO, MgAl 2 O 4, and SrTiO 3) using …

[HTML][HTML] Comprehensive study of the electronic and optical behavior of highly degenerate p-type Mg-doped GaN and AlGaN

BP Gunning, CAM Fabien, JJ Merola… - Journal of Applied …, 2015 - pubs.aip.org
The bulk and 2-dimensional (2D) electrical transport properties of heavily Mg-doped p-type
GaN films grown on AlN buffer layers by Metal Modulated Epitaxy are explored. Distinctions …

GaN and molecular beam epitaxy monitored by reflection high-energy electron diffraction

N Grandjean, J Massies - Applied physics letters, 1997 - pubs.aip.org
GaN and Al x Ga 1− x N alloys were grown by gas source molecular beam epitaxy using NH
3. High quality GaN layers with smooth surfaces being obtained, reflection high-energy …