Reinforcement learning based reliability-aware routing in IoT networks
The unprecedented scale and ubiquity of the Internet of Things (IoT) introduce a
maintainability challenge. IoT networks operate in diverse and harsh environments that …
maintainability challenge. IoT networks operate in diverse and harsh environments that …
Self-test and diagnosis for self-aware systems
MA Kochte, HJ Wunderlich - IEEE Design & Test, 2017 - ieeexplore.ieee.org
Self-testing hardware has a long tradition as a complement to manufacturing testing based
on test stimuli and response analysis. Today, it is a mature field and many complex SoCs …
on test stimuli and response analysis. Today, it is a mature field and many complex SoCs …
Wear‐out stress monitor utilising temperature and voltage sensitive ring oscillators
K Takeuchi, M Shimada, T Okagaki… - IET Circuits, Devices …, 2018 - Wiley Online Library
The authors propose an on‐chip wear‐out monitoring technique, which is based on
monitoring the environmental conditions experienced by a digital circuit. The frequency of …
monitoring the environmental conditions experienced by a digital circuit. The frequency of …
Experimental implementation of 8.9 kgate stress monitor in 28nm MCU along with safety software library for IoT device maintenance
K Takeuchi, M Shimada, S Konishi… - 2019 IEEE …, 2019 - ieeexplore.ieee.org
The on-chip stress monitor was experimentally implemented in a 28 nm automotive micro-
controller-unit (MCU) to demonstrate the contribution to long-term fatigue monitoring of the …
controller-unit (MCU) to demonstrate the contribution to long-term fatigue monitoring of the …
On-line prediction of NBTI-induced aging rates
Nanoscale technologies are increasingly susceptible to aging processes such as Negative-
Bias Temperature Instability (NBTI) which undermine the reliability of VLSI systems. Existing …
Bias Temperature Instability (NBTI) which undermine the reliability of VLSI systems. Existing …
FEOL/BEOL wear-out estimator using stress-to-frequency conversion of voltage/temperature-sensitive ring oscillators for 28nm automotive MCUs
K Takeuchi, M Shimada, T Okagaki… - … Solid-State Circuits …, 2016 - ieeexplore.ieee.org
We propose wear-out estimator of remaining lifetime, which consists of two types of custom
ring oscillators (ROs) and cumulative stress counters only. This on-chip estimator operates …
ring oscillators (ROs) and cumulative stress counters only. This on-chip estimator operates …
Device aging: A reliability and security concern
Device aging is an important concern in nanoscale designs. Due to aging the electrical
behavior of transistors embedded in an integrated circuit deviates from original intended …
behavior of transistors embedded in an integrated circuit deviates from original intended …
Design of an embedded health monitoring infrastructure for accessing multi-processor SoC degradation
Y Zhao, HG Kerkhoff - 2014 17th Euromicro Conference on …, 2014 - ieeexplore.ieee.org
An embedded health-monitoring infrastructure for a highly reliable MP-SoC for data-
streaming systems is presented. Different from the traditional approach of a dependable …
streaming systems is presented. Different from the traditional approach of a dependable …
Simulation study of aging in CMOS binary adders
T An, H Cai… - 2014 37th International …, 2014 - ieeexplore.ieee.org
Hot carrier injection (HCI) and negative bias temperature instability (NBTI) become dominant
reliability issues in nanometer CMOS technology. These aging effects can induce additional …
reliability issues in nanometer CMOS technology. These aging effects can induce additional …
Reconfigurable scan networks: formal verification, access optimization, and protection
R Baranowski - 2014 - elib.uni-stuttgart.de
To facilitate smooth VLSI development and improve chip dependability, VLSI designs
incorporate instrumentation for post-silicon validation and debug, volume test and diagnosis …
incorporate instrumentation for post-silicon validation and debug, volume test and diagnosis …