Sensor referenced real-time videolization of atomic force microscopy for nanomanipulations

L Liu, Y Luo, N Xi, Y Wang, J Zhang… - … /ASME Transactions on …, 2008 - ieeexplore.ieee.org
The main problem of atomic force microscopy (AFM)-based nanomanipulation is the lack of
real-time visual feedback. Although this problem has been partially solved by virtual reality …

Virtual reality interface for nano-manipulation based on enhanced images

MH Korayem, S Esmaeilzadehha - The International Journal of Advanced …, 2012 - Springer
Lacking real-time visual feedback is one of the main problems in working with AFM in a
nano-environment. To overcome this problem, we begin to design a virtual reality …

Atomic force yields a master nanomanipulator

J Zhang, N Xi, L Liu, H Chen… - IEEE Nanotechnology …, 2008 - ieeexplore.ieee.org
A nanorobotic system enables researchers to better handle nano-objects. To facilitate the
nanomanipulation and improve efficiency, an AFM-based nanorobotic system was …

On-line sensing and visual feedback for atomic force microscopy (afm) based nano-manipulations

B Song, N Xi, R Yang, K Wai, C Lai… - … Materials and Devices …, 2010 - ieeexplore.ieee.org
Atomic Force Microscopy (AFM) is a powerful and popular technique of single-molecule
imaging both in air and liquid. Recent research and hardware development provide AFM …

Local scan for compensation of drift contamination in AFM based nanomanipulation

Y Wang, G Li, L Liu - 2009 IEEE/RSJ International Conference …, 2009 - ieeexplore.ieee.org
Because of the presence of thermal drift, AFM (atomic force microscopy) images are always
contaminated. Such contamination is one of the major hampers to achieve accurate and …

Augmented Reality for Nano Manipulation

N Xi, B Song, R Yang, K Lai - Handbook of Augmented Reality, 2011 - Springer
In recent research in nano and micro world, the Atomic Force Microscope (AFM)[1] plays
more and more important role because of high resolution image [2] and vacuum free …

Compensation of drift contamination in AFM image by local scan

Y Wang, G Li, N Xi, L Liu - 2008 IEEE International Conference …, 2009 - ieeexplore.ieee.org
Thermal drift in atomic force microscopy (AFM) is one of the major hurdles to achieve
accurate and efficient AFM based nanomanipulation. AFM images are all contaminated by …

[引用][C] Sensor Referenced Real-Time Visual Feedback in Nanorobotic Manipulation and Assembly

L Liu, Y Wang, G Li, N Xi