Dry etching in the presence of physisorption of neutrals at lower temperatures

T Lill, IL Berry, M Shen, J Hoang, A Fischer… - Journal of Vacuum …, 2023 - pubs.aip.org
In this article, we give an overview about the chemical and physical processes that play a
role in etching at lower wafer temperatures. Conventionally, plasma etching processes rely …

[HTML][HTML] Fluorine-based plasmas: main features and application in micro-and nanotechnology and in surface treatment

C Cardinaud - Comptes Rendus Chimie, 2018 - Elsevier
Fluorine cold plasmas produced by an electrical discharge in SF 6, CF 4, CHF 3 or C 4 F 8
gases, principally, have two main fields of application. The first and historical application is …

Etching of and Si in fluorocarbon plasmas: A detailed surface model accounting for etching and deposition

E Gogolides, P Vauvert, G Kokkoris, G Turban… - Journal of Applied …, 2000 - pubs.aip.org
A surface model is presented for the etching of silicon (Si) and silicon dioxide (SiO 2) in
fluorocarbon plasmas. Etching and deposition are accounted for using a generalized …

The etching of polymers in oxygen‐based plasmas: A parametric study

O Joubert, J Pelletier, Y Arnal - Journal of applied physics, 1989 - pubs.aip.org
A parametric study of the etching of polymers has been performed in a 2.45‐GHz microwave
multipolar plasma using an electron‐cyclotron‐resonance excitation and an independent …

RF plasmas in methane: Prediction of plasma properties and neutral radical densities with combined gas-phase physics and chemistry model

E Gogolides, D Mary, A Rhallabi… - Japanese journal of …, 1995 - iopscience.iop.org
A combined plasma physics and chemistry simulator is presented and applied for rf methane
discharge in the 100 mTorr pressure range. The simulator consists of a self-consistent fluid …

Computer simulation of materials processing plasma discharges

LE Kline, MJ Kushner - Critical Reviews in Solid State and Material …, 1989 - Taylor & Francis
Process modeling is widely used in the design of both integrated circuits themselves and in
the design of integrated circuit manufacturing processes. Director1 gives an overview of the …

Radio‐frequency plasmas in CF4: Self‐consistent modeling of the plasma physics and chemistry

NV Mantzaris, A Boudouvis, E Gogolides - Journal of applied physics, 1995 - pubs.aip.org
A self‐consistent, one‐dimensional simulator for the physics and chemistry of radio
frequency plasmas is developed and applied for CF4. The simulator consists of a fluid model …

Mixing-layer kinetics model for plasma etching and the cellular realization in three-dimensional profile simulator

W Guo, B Bai, HH Sawin - Journal of Vacuum Science & Technology A, 2009 - pubs.aip.org
In this article the major kinetics models for plasma-surface interactions were reviewed
highlighting their strengths and limitations. As a subset of reactive-site modeling, mixing …

Statistical insights into the reaction of fluorine atoms with silicon

R Knizikevičius - Scientific reports, 2020 - nature.com
The dependences of silicon etching rate on the concentration of F atoms are investigated
theoretically. The nonlinear regression analysis of the experimental data indicates that the …

Laser-induced fluorescence detection of as a primary product of Si and reactive ion etching with gas

G Cunge, P Chabert, JP Booth - Plasma Sources Science and …, 1997 - iopscience.iop.org
The radical was detected in the gas phase during the etching of both Si and substrates
under reactive ion etching conditions in steady state and in the afterglow of pulsed plasmas …