The creation of soft errors due to the propagation of single event transients (SETs) is a
significant reliability challenge in modern CMOS logic. SET concerns continue to be …

An overview is presented of the significant influences of Moore's Law scaling on radiation
effects on microelectronics, focusing on historical trends and future needs. A number of …

Physical mechanisms of single-event effects that result in multiple-node charge collection or
charge sharing are reviewed and summarized. A historical overview of observed circuit …

There is an invisible enemy that constantly threatens the operation of electronics: ionizing
radiation. From sea level to outer space, ionizing radiation is virtually everywhere. At sea …

The ability for Single Event Transients (SETs) to induce soft errors in Integrated Circuits (ICs)
was predicted for the first time by Wallmark and Marcus in the early 60's and was confirmed …

Soft error rates for triple-well and dual-well SRAM circuits over the past few technology
generations have shown an apparently inconsistent behavior. This work compares the …

With the decrease of the device size, soft error induced by various particles becomes a
serious problem for advanced CMOS technologies. In this paper, we review the evolution of …

Layout Technique for Single-Event Transient Mitigation via Pulse Quenching Page 1 IEEE
TRANSACTIONS ON NUCLEAR SCIENCE, VOL. 58, NO. 3, JUNE 2011 885 Layout Technique …

Technology Scaling and Soft Error Reliability Page 1 Technology Scaling and Soft Error
Reliability Lloyd W. Massengill Professor, Department of Electrical Engineering and Computer …

Heavy-ion microbeam and broadbeam data are presented for a 65 nm bulk CMOS process
showing the existence of pulse quenching at normal and angular incidence for designs …