[HTML][HTML] Piezoelectric aluminum nitride thin-films: A review of wet and dry etching techniques

RMR Pinto, V Gund, C Calaza, KK Nagaraja… - Microelectronic …, 2022 - Elsevier
Aluminum nitride (AlN) is a technologically relevant material that can be deposited at low
temperatures in the form of thin-films while preserving most of its physical properties …

[HTML][HTML] Investigation and review of the thermal, mechanical, electrical, optical, and structural properties of atomic layer deposited high-k dielectrics: Beryllium oxide …

JT Gaskins, PE Hopkins, DR Merrill… - ECS Journal of Solid …, 2017 - iopscience.iop.org
Atomic layer deposited (ALD) high-dielectric-constant (high-k) materials have found
extensive applications in a variety of electronic, optical, optoelectronic, and photovoltaic …

Mechanical properties and reliability of aluminum nitride thin films

E Österlund, J Kinnunen, V Rontu, A Torkkeli… - Journal of Alloys and …, 2019 - Elsevier
Abstract Knowledge of the mechanical properties and fatigue behavior of thin films is
important for the design and reliability of microfabricated devices. This study uses the bulge …

Atomic layer deposition of AlN using atomic layer annealing—Towards high-quality AlN on vertical sidewalls

E Österlund, H Seppänen, K Bespalova… - Journal of Vacuum …, 2021 - pubs.aip.org
Atomic layer deposition (ALD) of aluminum nitride (AlN) using in situ atomic layer annealing
(ALA) is studied for microelectromechanical systems (MEMS). Effective piezoelectric in …

Beyond the highs and lows: A perspective on the future of dielectrics research for nanoelectronic devices

M Jenkins, DZ Austin, JF Conley, J Fan… - ECS Journal of Solid …, 2019 - iopscience.iop.org
High-dielectric constant (high-k) gate oxides and low-dielectric constant (low-k) interlayer
dielectrics (ILD) have dominated the nanoelectronic materials research scene over the past …

Influence of plasma chemistry on impurity incorporation in AlN prepared by plasma enhanced atomic layer deposition

AP Perros, H Hakola, T Sajavaara… - Journal of Physics D …, 2013 - iopscience.iop.org
Impurities in aluminum nitride films prepared by plasma enhanced atomic layer deposition
using NH 3-, N 2/H 2-and N 2-based plasmas are investigated by combining time-of-flight …

Deep SiO2 etching with Al and AlN masks for MEMS devices

V Bliznetsov, HM Lin, YJ Zhang… - … of Micromechanics and …, 2015 - iopscience.iop.org
Silicon oxide-based materials such as quartz and silica are widely used in
microelectromechanical systems (MEMS). One way to enhance the capability of their deep …

[HTML][HTML] Deep reactive ion etching of Z-cut alpha quartz for MEMS resonant devices fabrication

B Li, C Li, Y Zhao, C Han, Q Zhang - Micromachines, 2020 - mdpi.com
Quartz is widely used in microelectromechanical systems (MEMS). Especially, MEMS quartz
resonators are applied to sensors and serve as sensitive elements. The capability of deep …

Silicon micro-channel definition via ICP-RIE plasma etching process using different aluminum hardmasks

HS Alvarez, FH Cioldin, AR Silva… - Journal of …, 2021 - ieeexplore.ieee.org
In this work, thermally evaporated aluminum (Al) was used as hardmask (HM) to obtain
silicon microchannels (SiMCs), using an Inductively Coupled Plasma-Reactive Ion Etching …

Selective electrochemical etching of epitaxial aluminum nitride thin film

Y Choi, R Choi, J Kim - Applied Surface Science, 2020 - Elsevier
Aluminum nitride (AlN) has an ultra-wide bandgap energy of 6.2 eV and is resistant to
chemical etching owing to its high chemical stability, making it intractable in the device …