High-mobility nanocrystalline silicon thin-film transistors fabricated by plasma-enhanced chemical vapor deposition

CH Lee, A Sazonov, A Nathan - Applied Physics Letters, 2005 - pubs.aip.org
Hydrogenated nanocrystalline silicon (nc-Si: H) films were deposited by using 13.56 MHz
plasma-enhanced chemical vapor deposition at 260 C by means of a silane (Si H 4) plasma …

Plasma enhanced chemical vapor deposition of amorphous, polymorphous and microcrystalline silicon films

PR i Cabarrocas - Journal of non-crystalline solids, 2000 - Elsevier
The plasma processes and growth reactions involved in the deposition of amorphous,
polymorphous and microcrystalline silicon thin films are reviewed. The reference being a-Si …

Ultrafast carrier trapping in microcrystalline silicon observed in optical pump–terahertz probe measurements

P Uhd Jepsen, W Schairer, IH Libon, U Lemmer… - Applied Physics …, 2001 - pubs.aip.org
We report on direct evidence of ultrafast carrier dynamics displaying features on the
picosecond time scale in microcrystalline silicon (μc-Si: H). The dynamics of photogenerated …

Strategies for doped nanocrystalline silicon integration in silicon heterojunction solar cells

JP Seif, A Descoeudres, G Nogay… - IEEE journal of …, 2016 - ieeexplore.ieee.org
Carrier collection in silicon heterojunction (SHJ) solar cells is usually achieved by doped
amorphous silicon layers of a few nanometers, deposited at opposite sides of the crystalline …

Nanocrystalline silicon thin films prepared by low pressure planar inductively coupled plasma

D Raha, D Das - Applied surface science, 2013 - Elsevier
The present work deals with the optimization of nano-crystalline silicon films at a low
substrate temperature, using planar inductively coupled low pressure plasma CVD. The …

Methods of deposition of hydrogenated amorphous silicon for device applications

WG Van Sark - Handbook of Thin Films, 2002 - Elsevier
Publisher Summary This chapter describes the deposition of hydrogenated amorphous
silicon (a-Si: H) and related materials by employing a low-temperature, low-density plasma …

Characterization of traps in the gate dielectric of amorphous and nanocrystalline silicon thin-film transistors by 1/f noise

EG Ioannidis, A Tsormpatzoglou, DH Tassis… - Journal of Applied …, 2010 - pubs.aip.org
The low frequency noise technique is used to obtain the volume profile of traps in the SiN x
gate dielectric of hydrogenated amorphous silicon (a-Si: H) and nanocrystalline silicon (nc …

New challenges in thin film transistor (TFT) research

REI Schropp, B Stannowski, JK Rath - Journal of Non-Crystalline Solids, 2002 - Elsevier
This paper addresses the current trends in research and development for:(1) Thin film
transistors (TFTs) on plastic substrates,(2) low-temperature poly-silicon (LTPS) for the pixel …

Stability of nc-Si: H TFTs with silicon nitride gate dielectric

CH Lee, D Striakhilev, A Nathan - IEEE Transactions on …, 2006 - ieeexplore.ieee.org
We report the fabrication and characterization of bottom-gate and top-gate nanocrystalline
silicon (nc-Si: H) thin-film transistors (TFTs) with amorphous-silicon nitride (a-SiN x: H) as the …

Low-temperature-fabricated InGaZnO4 thin film transistors on polyimide clean-room tape

W Lim, EA Douglas, SH Kim, DP Norton… - Applied Physics …, 2008 - pubs.aip.org
Amorphous (α-) InGaZnO 4 thin film transistors (TFTs) were fabricated on polyimide clean-
room tape at low temperature (< 100 C)⁠. The α-InGaZnO 4 films with an n-type carrier …