Silicon carbide converters and MEMS devices for high-temperature power electronics: A critical review

X Guo, Q Xun, Z Li, S Du - Micromachines, 2019 - mdpi.com
The significant advance of power electronics in today's market is calling for high-
performance power conversion systems and MEMS devices that can operate reliably in …

Flexible High-Temperature MoS2 Field-Effect Transistors and Logic Gates

Y Zou, P Li, C Su, J Yan, H Zhao, Z Zhang, Z You - ACS nano, 2024 - ACS Publications
High-temperature-resistant integrated circuits with excellent flexibility, a high integration
level (nanoscale transistors), and low power consumption are highly desired in many fields …

Cascode GaN/SiC: A wide-bandgap heterogenous power device for high-frequency applications

J Xu, L Gu, Z Ye, S Kargarrazi… - IEEE Transactions on …, 2019 - ieeexplore.ieee.org
Wireless power transfer systems and plasma generators are among the increasing number
of applications that use high-frequency power converters. Increasing switching frequency …

Stable operation of AlGaN/GaN HEMTs for 25 h at 400° C in air

S Kargarrazi, AS Yalamarthy… - IEEE Journal of the …, 2019 - ieeexplore.ieee.org
Extreme environments such as the Venus atmosphere are among the emerging applications
that demand electronics that can withstand high-temperature oxidizing conditions. While …

[HTML][HTML] Study of heat transfer performance of miniature heat sink for integrated circuit packaging field

Z Li, W Li, Y Liu, M Xun, M Yuan - Case Studies in Thermal Engineering, 2023 - Elsevier
The miniature heat sink is an essential component in integrated circuit packaging, playing a
vital role in ensuring the stable and reliable performance of integrated circuits. In this paper …

Analysis of mobility for 4H-SiC N/P-channel MOSFETs up to 300° C

L Yang, Y Bai, C Li, H Chen, Z Han… - … on Electron Devices, 2021 - ieeexplore.ieee.org
The–characteristics of 4H-SiC N/P-channel MOSFETs have been carried out at high
temperatures up to 300° C. Different scattering mechanisms of surface mobility for 4H-SiC N …

Demonstration of CMOS integration with high-voltage double-implanted MOS in 4H-SiC

JY Jiang, JC Hung, KM Lo, CF Huang… - IEEE Electron …, 2020 - ieeexplore.ieee.org
In this work, we demonstrate CMOS integration that is fully compatible with a commercial
double-implanted MOS (DMOS) process in 4H-SiC without requiring additional masks and …

Thermal stability of TiN gate electrode for 4H-SiC MOSFETs and integrated circuits

V Van Cuong, T Meguro, S Ishikawa… - Japanese Journal of …, 2024 - iopscience.iop.org
In this research, the thermal stability of single-stage amplifiers based on a 4H-SiC MOSFET
with a TiN gate electrode was investigated. The results show that after 100 h aging at 400 C …

Temperature Sensing Elements for Harsh Environments in a 4H-SiC CMOS Technology

J Mo, J Li, A May, M Rommel… - IEEE Transactions on …, 2024 - ieeexplore.ieee.org
The demand for accurate temperature sensing in extreme temperatures is increasing.
Traditional silicon-based integrated temperature sensors usually cannot survive above 200° …

Gate Length Dependence of Bias Temperature Instabilities up to 400° C in 4H-SiC CMOS Devices

Z Dong, Y Bai, L Qiu, C Yang, J Hao… - IEEE Electron …, 2024 - ieeexplore.ieee.org
This letter reports the bias temperature instabilities (BTI) of 4H-SiC CMOS devices with
different gate lengths (L) and gate widths (W) for integrated circuits at 400° C for the first …