Reliability of HfO2-Based Ferroelectric FETs: A Critical Review of Current and Future Challenges

N Zagni, FM Puglisi, P Pavan… - Proceedings of the …, 2023 - ieeexplore.ieee.org
Ferroelectric transistors (FeFETs) based on doped hafnium oxide (HfO2) have received
much attention due to their technological potential in terms of scalability, high-speed, and …

Disturb-free operations of multilevel cell ferroelectric FETs for NAND applications

C Jin, J Xu, J Gu, J Zhao, X Jia, J Chen… - … on Electron Devices, 2023 - ieeexplore.ieee.org
We have experimentally investigated disturb-free operations of multilevel cell (MLC)
ferroelectric field-effect transistors (FeFETs) in a NAND array. The fabricated FeFET cells are …

Impact of domain wall motion on the memory window in a multidomain ferroelectric FET

N Pandey, YS Chauhan - IEEE Electron Device Letters, 2022 - ieeexplore.ieee.org
This letter studies the impact of multi-domain dynamics on the memory window (MW) of a
Ferroelectric FET (FeFET). The memory window primarily depends on the density of …

A compact model of ferroelectric field-effect transistor

CT Tung, G Pahwa, S Salahuddin… - IEEE Electron Device …, 2022 - ieeexplore.ieee.org
In this letter, we present a compact model of ferroelectric field-effect-transistor (FEFET). The
model consists of a ferroelectric (FE) capacitor model and a Berkeley Short-channel IGFET …

An analytical interpretation of the memory window in ferroelectric field-effect transistors

S Yoo, DH Choe, HJ Lee, S Jo, YS Lee, Y Park… - Applied Physics …, 2023 - pubs.aip.org
In this study, we present an analytical equation for describing the memory window of
ferroelectric field-effect transistors (FeFETs). The analytical equation is derived based on the …

Nucleation-limited switching dynamics model for efficient ferroelectrics circuit simulation

D Antoniadis, T Kim… - IEEE Transactions on …, 2021 - ieeexplore.ieee.org
The nucleation-limited switching (NLS) model has been shown in the literature to explain
successfully the dynamics of polarization switching of polycrystalline ferroelectric films (FE) …

A compact model of metal–ferroelectric-insulator–semiconductor tunnel junction

CT Tung, G Pahwa, S Salahuddin… - IEEE Transactions on …, 2021 - ieeexplore.ieee.org
In this article, we present a compact model of metal–ferroelectric (FE)–insulator–
semiconductor (MFIS) tunnel junction. Unlike the metal–FE–metal (MFM) structure with only …

On the modeling of polycrystalline ferroelectric thin films: Landau-based models versus Monte Carlo-based models versus experiment

M Thesberg, MNK Alam, B Truijen… - … on Electron Devices, 2022 - ieeexplore.ieee.org
Due to the potential for technological application, there has been an explosion of interest in
heavily polycrystalline ferroelectric nanofilms, such as those of doped hafnium oxide …

A compact model of antiferroelectric capacitor

CT Tung, S Salahuddin, C Hu - IEEE Electron Device Letters, 2021 - ieeexplore.ieee.org
In this paper, we develop a compact model of antiferroelectric (AFE) capacitors. AFE
material, similar to the ferroelectric (FE) material, is a good candidate for non-volatile …

A compact model for ferroelectric capacitors based on multidomain phase-field framework

M Adnaan, SC Chang, H Li, D Nikonov… - … on Electron Devices, 2023 - ieeexplore.ieee.org
A generalized and fast multidomain phase-field-based compact model for the metal-
ferroelectric-metal (MFM) capacitor is presented. Time-dependent Landau–Ginzburg (TDGL) …