Investigation of nanosheet-FET based logic gates at sub-7 nm technology node for digital IC applications

S Tayal, S Valasa, S Bhattacharya, J Ajayan… - Silicon, 2022 - Springer
The successful fabrication of Nanosheet (NS) FET by Samsung/IBM for below 7 nm
technology nodes has geared up the semiconductor industry towards future electronics. In …

Optimization of design space for vertically stacked junctionless nanosheet FET for analog/RF applications

S Valasa, S Tayal, LR Thoutam - Silicon, 2022 - Springer
This paper investigates the various device dimensions such as gate length (Lg), nanosheet
thickness (TNS), and nanosheet width to optimize the design space for vertically stacked …

Analog/RF performance analysis of channel engineered high-k gate-stack based junctionless trigate-FinFET

S Tayal, A Nandi - Superlattices and Microstructures, 2017 - Elsevier
In this paper, the effect of channel parameters like channel thickness (T Si) and channel
length (L g) on the analog/RF performance of high-K gate-stack based junctionless Trigate …

Performance evaluation of spacer dielectric engineered vertically stacked junctionless nanosheet FET for sub-5 nm technology node

S Valasa, S Tayal, LR Thoutam - ECS Journal of Solid State …, 2022 - iopscience.iop.org
This manuscript for the first time provides insights on the impact of different spacer materials
for the vertically stacked Junctionless Nanosheet Field Effect Transistor (JL-NSFET). The …

Optimization of gate-stack in junctionless Si-nanotube FET for analog/RF applications

S Tayal, A Nandi - Materials Science in Semiconductor Processing, 2018 - Elsevier
In this work, gate-stack based junctionless Si-nanotube (JLSiNT) FET is studied to
investigate the effect of high-K gate dielectric material in-conjunction with interfacial layer …

Analog/RF performance analysis of inner gate engineered junctionless Si nanotube

S Tayal, A Nandi - Superlattices and Microstructures, 2017 - Elsevier
This paper investigates the analog/RF performance of inner gate engineered junctionless
silicon nanotube (JLSiNT) FETs. We demonstrate that the RF performance of symmetric …

Optimization of Device Dimensions of High-k Gate Dielectric Based DG-TFET for Improved Analog/RF Performance

S Tayal, G Vibhu, S Meena, R Gupta - Silicon, 2022 - Springer
The optimization of device dimensions along with high-k gate dielectric is investigated in this
work for improving RF/analog performance of double gate (DG) TFET device. Through …

Demur and routing protocols with application in underwater wireless sensor networks for smart city

A Kumar, S Sharma - Energy-Efficient Underwater Wireless …, 2021 - igi-global.com
As everyone knows the internet of underwater things (IoUT) is an innovative discussion of
internet of things (IoT). To help the idea of IoUT, underwater wireless sensor networks …

Gate-stack optimization of a vertically stacked nanosheet FET for digital/analog/RF applications

S Tayal, S Bhattacharya, J Ajayan, LR Thoutam… - Journal of …, 2022 - Springer
Nanosheet field effect transistors (NS-FET) are a most promising candidate for next-
generation semiconductor devices for sub-7-nm technology nodes. This work explores a two …

Temperature sensitivity analysis of inner-gate engineered JL-SiNT-FET: An Analog/RF prospective

S Tayal, V Mittal, S Jadav, S Gupta, A Nandi, B Krishan - Cryogenics, 2020 - Elsevier
This paper explores the temperature sensitivity of Inner-gate engineered junctionless silicon
nanotube FET (JL-SiNT-FET) on analog/RF performance. It is found that the reduction in the …