X-ray diffraction (XRD) techniques are powerful, non-destructive characterization tool with
minimal sample preparation. XRD provides the first information about the materials phases …

Conspectus For almost a decade now, lead halide perovskite nanocrystals have been the
subject of a steadily growing number of publications, most of them regarding CsPbBr3 …

Structured light (SL)-based depth-sensing technology illuminates the objects with an array of
dots, and backscattered light is monitored to extract three-dimensional information …

In the previous chapter, we introduced basic concepts of symmetry and discussed the
structure of crystals in terms of three-dimensional periodic arrays of atoms and/or molecules …

The III-nitrides include the semiconductors AlN, GaN and InN, which have band gaps
spanning the entire UV and visible ranges. Thin films of III-nitrides are used to make UV …

With contributions by Paul F. Fewster and Christoph Genzel While X-ray diffraction
investigation of powders and polycrystalline matter was at the forefront of materials science …

The fundamental parameters approach to line profile fitting uses physically based models to
generate the line profile shapes. Fundamental parameters profile fitting (FPPF) has been …

High‐efficiency solar cells are essential for high‐density terrestrial applications, as well as
space and potentially vehicle applications. The optimum bandgap for the terrestrial spectrum …

In fast allen Kapiteln wurden kleinere Umstellungen und einige Ergänzungen mit einem
Zusatzseitenumfang von ca. 70-Seiten vorgenommen. Hier wird berücksichtigt, dass den …

During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has
grown as a result of the development of the semiconductor industry and the increasing …