Kinetic Monte Carlo simulation for semiconductor processing: A review

I Martin-Bragado, R Borges, JP Balbuena… - Progress in Materials …, 2018 - Elsevier
Abstract The Kinetic Monte Carlo (KMC) algorithm is a particularly apt technique to simulate
the complex processing of semiconductor devices. In this review, some of the main …

Progress with passivation and screen-printed metallization of Boron-doped monoPoly™ layers

P Padhamnath, N Nampalli, A Khanna, B Nagarajan… - Solar Energy, 2022 - Elsevier
In this work we have analyzed the doping, passivation and contact properties of boron-
doped (p+) polysilicon (poly-Si) layers to understand the two key limiting factors for industrial …

[HTML][HTML] Mechanisms of boron diffusion in silicon and germanium

S Mirabella, D De Salvador, E Napolitani… - Journal of Applied …, 2013 - pubs.aip.org
B migration in Si and Ge matrices raised a vast attention because of its influence on the
production of confined, highly p-doped regions, as required by the miniaturization trend. In …

Boron doping of silicon quantum dots via hydrogen silsesquioxane-capped diffusion for photovoltaics and medical imaging

S Milliken, IT Cheong, K Cui… - ACS Applied Nano …, 2022 - ACS Publications
Doped silicon quantum dots (SiQDs) with defined size, dopant distribution, and surface
chemistry are highly sought after as a scientific curiosity because their unique properties …

The interface inter-diffusion induced enhancement of the charge-trapping capability in HfO2/Al2O3 multilayered memory devices

X Lan, X Ou, Y Lei, C Gong, Q Yin, B Xu, Y Xia… - Applied Physics …, 2013 - pubs.aip.org
An effective method to generate traps at the interface was developed to enhance the charge
trapping capability of HfO 2/Al 2 O 3 multilayered memory devices. A high charge density …

Activation and carrier mobility in high fluence B implanted germanium

S Mirabella, G Impellizzeri, AM Piro, E Bruno… - Applied Physics …, 2008 - pubs.aip.org
High doping regimes of B implanted Ge have been accurately characterized combining Hall
effect technique and nuclear reaction analysis. Preamorphized Ge was implanted with B at …

In-situ measurement of self-atom diffusion in solids using amorphous germanium as a model system

E Hüger, F Strauß, J Stahn, J Deubener, M Bruns… - Scientific reports, 2018 - nature.com
We present in-situ self-diffusion experiments in solids, which were carried out by Focussing
Neutron Reflectometry on isotope multilayers. This new approach offers the following …

Self-diffusion in amorphous silicon

F Strauß, L Dörrer, T Geue, J Stahn, A Koutsioubas… - Physical review …, 2016 - APS
The present Letter reports on self-diffusion in amorphous silicon. Experiments were done on
Si 29/Si nat heterostructures using neutron reflectometry and secondary ion mass …

Anomalous Impurity Segregation and Local Bonding Fluctuation in -Si

G Fisicaro, K Huet, R Negru, M Hackenberg… - Physical Review Letters, 2013 - APS
Anomalous impurity redistribution after a laser irradiation process in group-IV elements has
been<? format?> reported in numerous papers. In this Letter, we correlate this still …

Atomistic simulations on the relationship between solid-phase epitaxial recrystallization and self-diffusion in amorphous silicon

M Posselt, H Bracht, D Radić - Journal of Applied Physics, 2022 - pubs.aip.org
Recent experimental results on self-diffusion (SD) in amorphous silicon (a-Si)[Kirschbaum et
al., Phys. Rev. Lett. 120, 225902 (2018)] indicate that the atomic mechanism of this process …