Computer-aided design (CAD), in its quest to facilitate new design revolutions, is again on
the brink of changing its scope. Following both historical and recent technological and …

Radiative sky cooling reduces the temperature of a system by promoting heat exchange with
the sky; its key advantage is that no input energy is required. We will review the origins of …

Today, micro-electronic circuits are undeniably and ubiquitously present in our society.
Transportation vehicles such as cars, trains, buses, and airplanes make abundant use of …

Counterfeit integrated circuits (ICs) pose a major concern to the industry and government as
they potentially impact the security and reliability of a wide variety of electronic systems. A …

Negative bias temperature instability (NBTI) has become the dominant reliability concern for
nanoscale PMOS transistors. In this paper, a predictive model is developed for the …

We present a brief overview of negative bias temperature instability (NBTI) commonly
observed for in p-channel metal–oxide–semiconductor field-effect transistors (MOSFETs) …

This paper presents a predictive model for the negative bias temperature instability (NBTI) of
PMOS under both short term and long term operation. Based on the reaction-diffusion (RD) …

Negative bias temperature instability (NBTI), in which interface traps and positive oxide
charge are generated in metal–oxide–silicon (MOS) structures under negative gate bias, in …

Negative bias temperature instability (NBTI) and channel hot carrier (CHC) are the leading
reliability concerns for nanoscale transistors. The de facto modeling method to analyze CHC …

Negative-bias-temperature instability (NBTI) has become the primary limiting factor of circuit
life time. In this paper, we develop a hierarchical framework for analyzing the impact of NBTI …