Page 1 Random Testing of Digital Circuits Theory and Applications O 10 7. boomd René
David Page 2 Page 3 Random Testing of Digital Circuits Page 4 Page 5 CRC) CRC Press …

Монография посвящена проблеме тестового диагностирования современных
вычислительных систем. Проанализированы основные тенденции …

The authors present test algorithms for go/no-go and diagnostic test of memories, covering
neighborhood pattern-sensitive faults (NPSFs). The proposed test algorithms are March …

. This is a compendium of state-of-the-art literature on diverse aspects of testing and testable
design of random access memories (RAMs), intended for design engineers and …

This article is a tutorial introduction to the field of semiconductor memory testing. It begins by
describing the structure and operation of the main types of semiconductor memory. The …

March algorithms are widely used in DRAM testing. They are relatively simple yet providing
high fault coverage especially with respect to stuck-at faults, address uniqueness faults, and …

This paper presents a new methodology for testing of bit-oriented and word-oriented RAMs
based on circular test sequences, which can be used for periodic and manufacturing testing …

In this work we investigate the problem of detection and location ofsingle and unlinked
multiple k-coupling faults in n× 1 random-access memories (RAMs). This fault model covers …

Describes four new test algorithms that detect different classes of physical neighborhood
pattern-sensitive faults (PNPSFs) in n/spl times/1 random-access memories (RAMs). All four …

This paper describes a synthesizable, transparent, built-in self-test (BIST) scheme for
random-access memories (RAMs). By altering only two parameters in a VHDL specification …