Atomic layer deposition—Sequential self-limiting surface reactions for advanced catalyst “bottom-up” synthesis

J Lu, JW Elam, PC Stair - Surface Science Reports, 2016 - Elsevier
Catalyst synthesis with precise control over the structure of catalytic active sites at the atomic
level is of essential importance for the scientific understanding of reaction mechanisms and …

Metal ALD and pulsed CVD: Fundamental reactions and links with solution chemistry

DJH Emslie, P Chadha, JS Price - Coordination Chemistry Reviews, 2013 - Elsevier
Atomic layer deposition (ALD) is a thin film deposition technique which operates via
repeated alternating and self-terminating surface-based reactions between a precursor and …

Atomic layer deposition of noble metals and their oxides

J Hämäläinen, M Ritala, M Leskelä - Chemistry of Materials, 2014 - ACS Publications
Atomic layer deposition (ALD) is an attractive method to deposit thin films for advanced
technological applications such as microelectronics and nanotechnology. One material …

Low temperature ABC-type Ru atomic layer deposition through consecutive dissociative chemisorption, combustion, and reduction steps

J Lu, JW Elam - Chemistry of Materials, 2015 - ACS Publications
Thermal atomic layer deposition (ALD) of noble metals is frequently performed using
molecular oxygen as the nonmetal precursor to effect combustion-type chemistry at relatively …

Atomic layer deposition of ruthenium films from (ethylcyclopentadienyl)(pyrrolyl) ruthenium and oxygen

K Kukli, M Kemell, E Puukilainen, J Aarik… - Journal of The …, 2011 - iopscience.iop.org
Ru films were grown by atomic layer deposition in the temperature range of using
(ethylcyclopentadienyl)(pyrrolyl) ruthenium and air or oxygen as precursors on HF-etched …

Atomic layer deposition of Ru from CpRu (CO) 2Et using O2 gas and O2 plasma

N Leick, ROF Verkuijlen, L Lamagna… - Journal of Vacuum …, 2011 - pubs.aip.org
The metalorganic precursor cyclopentadienylethyl (dicarbonyl) ruthenium (CpRu (CO) 2 Et)
was used to develop an atomic layer deposition (ALD) process for ruthenium. O 2 gas and O …

Atomic layer deposition of Ru films from bis (2, 5-dimethylpyrrolyl) ruthenium and oxygen

K Kukli, J Aarik, A Aidla, I Jõgi, T Arroval, J Lu… - Thin Solid Films, 2012 - Elsevier
Ru thin films were grown on hydrogen terminated Si, SiO2, Al2O3, HfO2, and TiO2 surfaces
by atomic layer deposition from bis (2, 5-dimethylpyrrolyl) ruthenium precursor and oxygen …

Chemistry of ruthenium diketonate atomic layer deposition (ALD) precursors on metal surfaces

X Qin, F Zaera - The Journal of Physical Chemistry C, 2018 - ACS Publications
The thermal chemistry of tris (2, 2, 6, 6-tetramethyl-3, 5-heptanedionato) ruthenium (III)(Ru
(tmhd) 3), a potential precursor for the chemical deposition of ruthenium-containing films, on …

Substrate reactivity effects in the atomic layer deposition of aluminum oxide from trimethylaluminum on ruthenium

M Tallarida, K Kukli, M Michling, M Ritala… - Chemistry of …, 2011 - ACS Publications
A detailed study of the atomic layer deposition of Al2O3 on Ru film surfaces by means of in
situ photoelectron spectroscopy has been carried out. We discuss how the atomic layer …

Dehydrogenation Reactions during Atomic Layer Deposition of Ru Using O2

N Leick, S Agarwal, AJM Mackus… - Chemistry of …, 2012 - ACS Publications
The surface reactions during the atomic layer deposition (ALD) of Ru using an
organometallic precursor [CpRu (CO) 2Et] and O2 gas were studied using quadrupole mass …