Recent advances and trends in advanced packaging
JH Lau - IEEE Transactions on Components, Packaging and …, 2022 - ieeexplore.ieee.org
In this study, advanced packaging is defined. The kinds of advanced packaging are ranked
based on their interconnect density and electrical performance, and are grouped into 2-D …
based on their interconnect density and electrical performance, and are grouped into 2-D …
Recent advances and trends in fan-out wafer/panel-level packaging
JH Lau - Journal of Electronic Packaging, 2019 - asmedigitalcollection.asme.org
The recent advances and trends in fan-out wafer/panel-level packaging (FOW/PLP) are
presented in this study. Emphasis is placed on:(A) the package formations such as (a) chip …
presented in this study. Emphasis is placed on:(A) the package formations such as (a) chip …
[图书][B] Advanced packaging
JH Lau, JH Lau - 2021 - Springer
First of all, semiconductor technology is out of the scope of this book and semiconductor
advanced packaging technology is the focus. In this chapter, the advanced packaging will …
advanced packaging technology is the focus. In this chapter, the advanced packaging will …
Recent advances and trends in multiple system and heterogeneous integration with TSV-less interposers
JH Lau - IEEE Transactions on Components, Packaging and …, 2022 - ieeexplore.ieee.org
In this study, the recent advances and trends in multiple system and heterogeneous
integration with through-silicon via (TSV)-less interposer (organic interposer or 2.3-D IC …
integration with through-silicon via (TSV)-less interposer (organic interposer or 2.3-D IC …
A review of system-in-package technologies: application and reliability of advanced packaging
H Wang, J Ma, Y Yang, M Gong, Q Wang - Micromachines, 2023 - mdpi.com
The system-in-package (SiP) has gained much interest in the current rapid development of
integrated circuits (ICs) due to its advantages of integration, shrinking, and high density. This …
integrated circuits (ICs) due to its advantages of integration, shrinking, and high density. This …
[HTML][HTML] Enhancement of electromigration lifetime of copper lines by eliminating nanoscale grains in highly< 111>-oriented nanotwinned structures
In this study, we designed and electroplated various regular and nanotwinned copper (nt-
Cu) lines. These Cu lines were then covered with a polyimide (PI) layer and heat-treated to …
Cu) lines. These Cu lines were then covered with a polyimide (PI) layer and heat-treated to …
Panel-level fan-out RDL-first packaging for heterogeneous integration
JH Lau, CT Ko, KM Yang, CY Peng… - IEEE Transactions …, 2020 - ieeexplore.ieee.org
In this article, the fan-out chip-last panel-level packaging for heterogeneous integration is
investigated. Emphasis is placed on the design, materials, process, fabrication, and …
investigated. Emphasis is placed on the design, materials, process, fabrication, and …
Comparison of mechanical modeling to warpage estimation of RDL-first fan-out panel-level packaging
CC Lee, CW Wang, CY Chen - IEEE Transactions on …, 2022 - ieeexplore.ieee.org
To meet the requirements of low cost, thin vehicles, and multiple functions, the fan-out panel-
level packaging (FO-PLP) is introduced to be one of the next-generation packaging …
level packaging (FO-PLP) is introduced to be one of the next-generation packaging …
Printed electronics technologies for additive manufacturing of hybrid electronic sensor systems
Requirements for the miniaturization of electronics are constantly increasing as more and
more functions are aimed to be integrated into a single device. At the same time, there are …
more functions are aimed to be integrated into a single device. At the same time, there are …
An overview of AI-assisted design-on-simulation technology for reliability life prediction of advanced packaging
SK Panigrahy, YC Tseng, BR Lai, KN Chiang - Materials, 2021 - mdpi.com
Several design parameters affect the reliability of wafer-level type advanced packaging,
such as upper and lower pad sizes, solder volume, buffer layer thickness, and chip …
such as upper and lower pad sizes, solder volume, buffer layer thickness, and chip …