Defect engineering in SiC technology for high-voltage power devices
T Kimoto, H Watanabe - Applied Physics Express, 2020 - iopscience.iop.org
Major features of silicon carbide (SiC) power devices include high blocking voltage, low on-
state loss, and fast switching, compared with those of the Si counterparts. Through recent …
state loss, and fast switching, compared with those of the Si counterparts. Through recent …
Emerging SiC applications beyond power electronic devices
In recent years, several new applications of SiC (both 4H and 3C polytypes) have been
proposed in different papers. In this review, several of these emerging applications have …
proposed in different papers. In this review, several of these emerging applications have …
High-voltage SiC power devices for improved energy efficiency
T Kimoto - Proceedings of the Japan Academy, Series B, 2022 - jstage.jst.go.jp
Silicon carbide (SiC) power devices significantly outperform the well-established silicon (Si)
devices in terms of high breakdown voltage, low power loss, and fast switching. This review …
devices in terms of high breakdown voltage, low power loss, and fast switching. This review …
SiC complementary junction field-effect transistor logic gate operation at 623 K
M Kaneko, M Nakajima, Q Jin… - IEEE Electron Device …, 2022 - ieeexplore.ieee.org
Here, we show that silicon carbide (SiC) complementary logic gates composed of p-and n-
channel junction field-effect transistors (JFETs) fabricated by ion implantation operate at 623 …
channel junction field-effect transistors (JFETs) fabricated by ion implantation operate at 623 …
A novel optimum variation lateral doping SiC lateral double-diffused metal oxide semiconductor with improved performance
M Kong, Y Duan, J Gao, R Yan… - Semiconductor …, 2022 - iopscience.iop.org
In thsi paper a novel optimum variation lateral doping 4H-SiC lateral double-diffused metal
oxide semiconductor (LDMOS) field-effect transistor with improved performance is proposed …
oxide semiconductor (LDMOS) field-effect transistor with improved performance is proposed …
Experimental determination of impact ionization coefficients along< 1120> in 4H-SiC
The impact ionization coefficients along the (112̅0) direction in 4H-SiC were extracted by
analyzing photocurrent of mesa epitaxial pn diodes with punchthrough (PT) structures …
analyzing photocurrent of mesa epitaxial pn diodes with punchthrough (PT) structures …
Tunneling current in 4H-SiC pn junction diodes
Heavily doped 4H-silicon carbide (SiC) epitaxial pn junction diodes are fabricated, and their
tunneling current under reverse-biased condition is investigated. Soft increase of the …
tunneling current under reverse-biased condition is investigated. Soft increase of the …
Physical properties of sulfur double donors in 4H-SiC introduced by ion implantation
The activation ratio and the ionization energy (ΔE) of sulfur (S) atoms implanted in n-type 4H-
SiC were investigated. It was revealed that implanted sulfur atoms show almost no diffusion …
SiC were investigated. It was revealed that implanted sulfur atoms show almost no diffusion …
CJM: a compact model for double-gate junction FETs
The double-gate (DG) junction field-effect transistor (JFET) is a classical electron device,
with a simple structure that presents many advantages in terms of device fabrication but also …
with a simple structure that presents many advantages in terms of device fabrication but also …
Carrier trapping effects on forward characteristics of SiC pin diodes fabricated on high-purity semi-insulating substrates
Carrier trapping effects of high-concentration deep levels in high-purity semi-insulating
(HPSI) silicon carbide (SiC) substrates on device characteristics were investigated. Vertical …
(HPSI) silicon carbide (SiC) substrates on device characteristics were investigated. Vertical …