Over the past several decades, atomic force microscopy (AFM) has advanced from a
technique used primarily for surface topography imaging to one capable of characterizing a …

The ability to probe structures and functional properties of complex systems at the
nanoscale, both at their surface and in their volume, has drawn substantial attention in …

Imaging of subsurface features down to the nanometer scale is of great importance in
various fields such as microelectronics, materials science, nanobiology, and nanomedicine …

The goal of this lecture is to provide an overview of the recent advances in high-resolution
ultrasonic imaging principles and techniques and their biomedical applications. This lecture …

Recently, some papers reported successful imaging of subsurface features using atomic
force microscopy (AFM). Some theoretical studies have also been presented, however the …

To meet the surging demands for quantitative and nondestructive testing at the nanoscale in
various fields, ultrasonic-based scanning probe microscopy techniques, such as contact …

Nondestructive subsurface nanoimaging of buried nanostructures is considered to be
extremely challenging and is essential for the reliable manufacturing of nanotechnology …

Since its discovery, atomic force microscopy (AFM) has become widely used for surface
characterization, evolving from a tool for probing surface topography to a versatile method …

To make the forces in an Atomic Force Microscope that operates in a dynamic mode with
one or multiple vibrations applied to the cantilever, quantitative, one needs to relate a …

It is well known that sub-surface nano-objects can be detected by Atomic Force Microscopy
(AFM) with either sub-surface stress or electric fields, by using dynamic AFM methods such …