[HTML][HTML] New challenges of miniaturization of electronic devices: Electromigration and thermomigration in lead-free solder joints

P Zhang, S Xue, J Wang - Materials & Design, 2020 - Elsevier
The continuous improvement of electronic device performances and the advancement of
packaging technology have brought greater challenges to the reliability of solder joints in …

A review on nanodispersed lead-free solders in electronics: synthesis, microstructure and intermetallic growth characteristics

M Bharath Krupa Teja, A Sharma, S Das… - Journal of Materials …, 2022 - Springer
Lead-free solder research has witnessed a great jump in the past decades due to the
increased restrictions over the use of toxic lead-bearing solder alloys. Among the …

Hybrid metal oxide nanocomposites for gas-sensing applications: a review

P Berwal, S Sihag, S Rani, A Kumar… - Industrial & …, 2023 - ACS Publications
Nowadays, environmental pollution is a major concern due to toxic gases released by an
increased number of vehicles, industries, and manufacturing plants worldwide. These toxic …

Effect of nanoparticles addition on the microstructure and properties of lead-free solders: a review

P Zhang, S Xue, J Wang, P Xue, S Zhong, W Long - Applied Sciences, 2019 - mdpi.com
With the development of microelectronic packaging and increasingly specific service
environment of solder joints, much stricter requirements have been placed on the properties …

Influence of dual ceramic nanomaterials on the solderability and interfacial reactions between lead-free Sn-Ag-Cu and a Cu conductor

DH Jung, A Sharma, JP Jung - Journal of Alloys and Compounds, 2018 - Elsevier
This study examined the addition of dual ceramic nanomaterials, TiO 2 and graphene (0,
0.03, 0.12, 0.21, and 0.60 wt%), to a lead-free Sn-3.0 wt% Ag-0.5 wt% Cu (SAC305) solder …

Boron nitride nanotubes modified on a lead-free solder alloy for microelectromechanical packaging

B Sharma, M Kumar, V Kumar… - ACS Applied Nano …, 2022 - ACS Publications
In this study, we have investigated the role of boron nitride nanotubes (BNNTs) on the
microstructural and interconnection reliability of a Sn–3.0 wt% Ag–0.5 wt% Cu (SAC305) …

On the potential of tungsten as next-generation semiconductor interconnects

D Choi, K Barmak - Electronic Materials Letters, 2017 - Springer
The continuous scaling of copper (Cu) interconnects produced two major shortcomings–a
severe resistivity size effect and material reliability issues. Tungsten (W), with the expected …

Recent progress of Sn–Ag–Cu lead-free solders bearing alloy elements and nanoparticles in electronic packaging

J Wu, S Xue, J Wang, S Liu, Y Han, L Wang - Journal of Materials Science …, 2016 - Springer
Abstract Sn–Ag–Cu lead-free solders, containing alloy elements and nanoparticles, have
been extensively investigated. With the extensive prevalence of 3D IC package, a major …

Electromigration in solder joints: A cross-sectioned model system for real-time observation

M AbdelAziz, DE Xu, G Wang, M Mayer - Microelectronics Reliability, 2021 - Elsevier
With the increasing demands and consequent miniaturization of electronic devices,
electromigration is posing a challenge to the reliability not only of integrated circuits but also …

Effect of nickel (Ni) on the growth rate of Cu6Sn5 intermetallic compounds between Sn–Cu–Bi solder and Cu substrate

H Gao, F Wei, Y Sui, J Qi, Y He, Q Meng - Journal of Materials Science …, 2019 - Springer
In this work, the lead-free composite solder was fabricated by mixing Ni element with Sn–0.7
Cu–10Bi solder. The effect of nickel (Ni) addition on the growth behavior of intermetallic …