Recent Advances on SEM‐Based In Situ Multiphysical Characterization of Nanomaterials

J Qu, X Liu - Scanning, 2021 - Wiley Online Library
Functional nanomaterials possess exceptional mechanical, electrical, and optical properties
which have significantly benefited their diverse applications to a variety of scientific and …

Four-probe electrical transport measurements on individual metallic nanowires

AS Walton, CS Allen, K Critchley, MŁ Górzny… - …, 2007 - iopscience.iop.org
This work presents nanoscale four-probe measurements on metallic nanowires using
independently controlled scanning tunnelling microscope tips. This technique has allowed …

Four-probe electrical characterization of Pt-coated TMV-based nanostructures

MŁ Górzny, AS Walton, M Wnęk, PG Stockley… - …, 2008 - iopscience.iop.org
The electrical transport and structural properties of tobacco mosaic virus (TMV)-based
nanostructures have been studied. Electroless deposition was used to coat the TMV outer …

Investigating the impact of SEM chamber conditions and imaging parameters on contact resistance of in situ nanoprobing

J Qu, M Lee, M Hilke, X Liu - Nanotechnology, 2017 - iopscience.iop.org
In this paper, we investigate the impact of vacuum chamber conditions (cleanliness level
and vacuum pressure) and imaging parameters (magnification and acceleration voltage) of …

Measurement of propagation of ultrafast surface plasmon polariton pulses using dual-probe scanning near-field optical microscopy

Y Masaki, K Tomita, Y Kojima, F Kannari - Applied Optics, 2019 - opg.optica.org
We report the construction of diagnostics for ultrafast surface plasmon polariton (SPP)
pulses that evolve spatiotemporally in femtosecond and nanometer scales. We constructed …

Multiprobe NSOM fluorescence

S Berezin, BS Kalanoor, H Taha, Y Garini… - …, 2014 - degruyter.com
In this paper, we demonstrate simultaneous AFM/NSOM using a dual-tip normal tuning-fork
based scanning probe microscope. By scanning two SPM probes simultaneously, one …

Design and development of scanning eddy current force microscopy for characterization of electrical, magnetic and ferroelectric properties with nanometer resolution

V Nalladega - 2009 - rave.ohiolink.edu
This dissertation describes the design and development of a new high-resolution electrical
conductivity imaging technique combining the basic principles of eddy currents and atomic …

[PDF][PDF] Multi-physical Characterization of Micro-and Nanomaterials: A Review

J Qu, X Liu - Multi-physical Characterization of Micro-and …, 2019 - escholarship.mcgill.ca
Functional micro-and nanomaterials possess exceptional mechanical, electrical and optical
properties which have significantly benefited their diverse applications to a variety of …

Multiprobe Electrical Measurements without Optical Interference

D Lewis, A Ignatov, S Krol, R Dekhter… - Conductive Atomic …, 2017 - Wiley Online Library
This chapter focuses on the nascent technology of multiprobe scanned probe microscopy
(SPM) and its applications in advanced SPM studies. These include a wide variety of …