[图书][B] Aberration-corrected imaging in transmission electron microscopy: An introduction
R Erni - 2015 - books.google.com
Aberration-Corrected Imaging in Transmission Electron Microscopy provides an introduction
to aberration-corrected atomic-resolution electron microscopy imaging in materials and …
to aberration-corrected atomic-resolution electron microscopy imaging in materials and …
Stability and dynamics of small molecules trapped on graphene
Chromatic and spherical aberration-corrected atomic-resolution transmission electron
microscopy combined with density-functional theory calculations is employed to elucidate …
microscopy combined with density-functional theory calculations is employed to elucidate …
Computation in electron microscopy
EJ Kirkland - Acta Crystallographica Section A: Foundations and …, 2016 - journals.iucr.org
Some uses of the computer and computation in high-resolution transmission electron
microscopy are reviewed. The theory of image calculation using Bloch wave and multislice …
microscopy are reviewed. The theory of image calculation using Bloch wave and multislice …
Instrumental requirements for the detection of electron beam-induced object excitations at the single atom level in high-resolution transmission electron microscopy
This contribution touches on essential requirements for instrument stability and resolution
that allows operating advanced electron microscopes at the edge to technological …
that allows operating advanced electron microscopes at the edge to technological …
[图书][B] Characterization of nanostructures
S Myhra, JC Rivière - 2012 - books.google.com
The techniques and methods that can be applied to materials characterization on the
microscale are numerous and well-established. Divided into two parts, Characterization of …
microscale are numerous and well-established. Divided into two parts, Characterization of …
Using a monochromator to improve the resolution in TEM to below 0.5 Å. Part II: Application to focal series reconstruction
PC Tiemeijer, M Bischoff, B Freitag, C Kisielowski - Ultramicroscopy, 2012 - Elsevier
We apply monochromated illumination to improve the information transfer in focal series
reconstruction to 0.5 Å at 300kV. Contrary to single images, which can be taken arbitrarily …
reconstruction to 0.5 Å at 300kV. Contrary to single images, which can be taken arbitrarily …
Accuracy and precision of thickness determination from position-averaged convergent beam electron diffraction patterns using a single-parameter metric
Position-averaged convergent beam electron diffraction patterns are formed by averaging
the transmission diffraction pattern while scanning an atomically-fine electron probe across …
the transmission diffraction pattern while scanning an atomically-fine electron probe across …
Projected thickness reconstruction from a single defocused transmission electron microscope image of an amorphous object
Single defocused transmission electron microscope phase contrast images are used to
reconstruct the projected thickness map of a single-material object. The algorithm is non …
reconstruct the projected thickness map of a single-material object. The algorithm is non …
Comparison of approaches and artefacts in the measurement of detector modulation transfer functions
CB Boothroyd, T Kasama, RE Dunin-Borkowski - Ultramicroscopy, 2013 - Elsevier
In order to investigate the reproducibility of measurements of transmission electron
microscope detector modulation transfer functions (MTFs) we measure the MTF of a charge …
microscope detector modulation transfer functions (MTFs) we measure the MTF of a charge …
High precision measurements of atom column positions using model-based exit wave reconstruction
In this paper, it has been investigated how to measure atom column positions as accurately
and precisely as possible using a focal series of images. In theory, it is expected that the …
and precisely as possible using a focal series of images. In theory, it is expected that the …