A suite of IEEE 1687 benchmark networks

A Tšertov, A Jutman, S Devadze… - 2016 IEEE …, 2016 - ieeexplore.ieee.org
The saturation of the IJTAG concept and its approval as the IEEE 1687 standard in 2014 has
generated a wave of research activities and created demand for a set of appropriate and …

A survey on security threats and countermeasures in IEEE test standards

E Valea, M Da Silva, G Di Natale, ML Flottes… - IEEE Design & …, 2019 - hal.science
The growth in complexity of Integrated Circuits (IC) is supported, amongst other factors, by
the development of standardized test infrastructures. The feasibility of both end …

Specification and verification of security in reconfigurable scan networks

MA Kochte, M Sauer, LR Gomez… - 2017 22nd IEEE …, 2017 - ieeexplore.ieee.org
A large amount of on-chip infrastructure, such as design-for-test, debug, monitoring, or
calibration, is required for the efficient manufacturing, debug, and operation of complex …

Trustworthy reconfigurable access to on-chip infrastructure

MA Kochte, R Baranowski… - 2017 International Test …, 2017 - ieeexplore.ieee.org
The accessibility of on-chip embedded infrastructure for test, reconfiguration, or debug
poses a serious security problem. Access mechanisms based on IEEE Std 1149.1 (JTAG) …

Security against data-sniffing and alteration attacks in IJTAG

R Elnaggar, R Karri… - IEEE Transactions on …, 2020 - ieeexplore.ieee.org
The IEEE Std. 1687 (IJTAG) facilitates access to on-chip instruments in complex system-on-
chip designs. However, a major security vulnerability in IJTAG has yet to be addressed …

Optimization-based test scheduling for IEEE 1687 multi-power domain networks using Boolean satisfiability

P Habiby, S Huhn, R Drechsler - 2021 16th International …, 2021 - ieeexplore.ieee.org
The IEEE 1687 Std. provides an efficient access methodology for embedded instruments in
complex system-on-a-chip designs by introducing reconfigurable scan networks. This …

Test of reconfigurable modules in scan networks

R Cantoro, FG Zadegan, M Palena… - IEEE Transactions …, 2018 - ieeexplore.ieee.org
Modern devices often include several embedded instruments, such as BIST interfaces,
sensors, calibration facilities. New standards, such as IEEE Std 1687, provide vehicles to …

On secure data flow in reconfigurable scan networks

P Raiola, B Thiemann, J Burchard… - … , Automation & Test …, 2019 - ieeexplore.ieee.org
Reconfigurable Scan Networks (RSNs) allow flexible access to embedded instruments for
post-silicon test, validation and debug or diagnosis. The increased observability and …

Co-relation scan attack analysis (COSAA) on AES: A comprehensive approach

Y Sao, SS Ali, D Ray, S Singh, S Biswas - Microelectronics Reliability, 2021 - Elsevier
Scan based DfT is indispensable for IC testing in the semiconductor chip industry to ensure
correctness of chip, both functionally and structurally. Since a higher degree of fault …

Formal verification of secure reconfigurable scan network infrastructure

MA Kochte, R Baranowski, M Sauer… - 2016 21th IEEE …, 2016 - ieeexplore.ieee.org
Reconfigurable scan networks (RSN) as standardized by IEEE Std 1687 allow flexible and
efficient access to on-chip infrastructure for test and diagnosis, post-silicon validation …