Statistical timing analysis: From basic principles to state of the art

D Blaauw, K Chopra, A Srivastava… - IEEE transactions on …, 2008 - ieeexplore.ieee.org
Static-timing analysis (STA) has been one of the most pervasive and successful analysis
engines in the design of digital circuits for the last 20 years. However, in recent years, the …

[图书][B] Advanced field-solver techniques for RC extraction of integrated circuits

W Yu, X Wang - 2014 - Springer
The main goal of writing this book was to present a methodological and algorithmic
perspective on the field-solver-based parasitic extraction of integrated circuits (ICs) …

Visualization of health‐subject analysis based on query term co‐occurrences

J Zhang, D Wolfram, P Wang, Y Hong… - Journal of the American …, 2008 - Wiley Online Library
A multidimensional‐scaling approach is used to analyze frequently used medical‐topic
terms in queries submitted to a Web‐based consumer health information system. Based on …

A sparse grid based spectral stochastic collocation method for variations-aware capacitance extraction of interconnects under nanometer process technology

H Zhu, X Zeng, W Cai, J Xue… - 2007 Design, Automation …, 2007 - ieeexplore.ieee.org
In this paper, a spectral stochastic collocation method (SSCM) is proposed for the
capacitance extraction of interconnects with stochastic geometric variations for nanometer …

Portable space mapping for efficient statistical modeling of passive components

L Zhang, PH Aaen, J Wood - IEEE transactions on microwave …, 2012 - ieeexplore.ieee.org
In this paper, a portable space-mapping technique is presented for efficient statistical
modeling of passive components. The proposed technique utilizes the cost-effective model …

A Markov chain based hierarchical algorithm for fabric-aware capacitance extraction

T El-Moselhy, IM Elfadel… - IEEE Transactions on …, 2010 - ieeexplore.ieee.org
In this paper, we propose a hierarchical algorithm to compute the 3-D capacitances of a
large number of topologically different layout configurations that are all assembled from the …

[图书][B] Statistical performance analysis and modeling techniques for nanometer VLSI designs

R Shen, SXD Tan, H Yu - 2012 - books.google.com
Since process variation and chip performance uncertainties have become more pronounced
as technologies scale down into the nanometer regime, accurate and efficient modeling or …

基于因子分析法的滑坡变形分析

张婷婷, 晏鄂川, 胡显明, 范彬彬 - 长江科学院院报, 2012 - ckyyb.crsri.cn
滑坡位移监测资料是我们认识滑坡的基本信息之一, 但并非任何的滑坡监测资料都能够直观地
反映出滑坡的变形特征, 因此采用因子分析法对三峡库区某滑坡的位移监测资料进行分析 …

An efficient method for chip-level statistical capacitance extraction considering process variations with spatial correlation

W Zhang, W Yu, Z Wang, Z Yu, R Jiang… - Proceedings of the …, 2008 - dl.acm.org
An efficient method is proposed to consider the process variations with spatial correlation,
for chip-level capacitance extraction based on the window technique. In each window, an …

Variational capacitance extraction of on-chip interconnects based on continuous surface model

W Yu, C Hu, W Zhang - Proceedings of the 46th Annual Design …, 2009 - dl.acm.org
In this paper we present a continuous surface model to describe the interconnect geometric
variation, which improves the currently used model for better accuracy while not increasing …