Structural dynamics of microsystems—current state of research and future directions

RM Lin, WJ Wang - Mechanical systems and signal processing, 2006 - Elsevier
Microsystems or micro-electro-mechanical systems (MEMS), as a newly emerged
revolutionary enabling technology, has brought both opportunities and challenges to the …

Characterization of the static and dynamic behaviour of M (O) EMS by optical techniques: status and trends

A Bosseboeuf, S Petitgrand - Journal of micromechanics and …, 2003 - iopscience.iop.org
Optical techniques which were developed for ex situ characterization of static
displacements, motions, vibrations and internal strain of micromechanical devices and M (O) …

[图书][B] Optical inspection of Microsystems

W Osten, A Duparre, C Furlong, I De Wolf, A Asundi… - 2018 - taylorfrancis.com
Where conventional testing and inspection techniques fail at the micro-scale, optical
techniques provide a fast, robust, and relatively inexpensive alternative for investigating the …

3D measurement of micromechanical devices vibration mode shapes with a stroboscopic interferometric microscope

S Petitgrand, R Yahiaoui, K Danaie… - Optics and lasers in …, 2001 - Elsevier
Microscopic interferometry is a powerful technique for the static and dynamic
characterization of micromechanical devices. In this paper we emphasize its capabilities for …

Application of microscopic interferometry techniques in the MEMS field

A Bosseboeuf, S Petitgrand - … Engineering: Metrology and …, 2003 - spiedigitallibrary.org
Microscopic homodyne interferometry with monochromatic or white light illumination is up to
now the most widely used technique for micromechanical devices and MEMS surface …

Quantitative time-averaged microscopic interferometry for micromechanical device vibration mode characterization

S Petitgrand, R Yahiaoui… - Microsystems …, 2001 - spiedigitallibrary.org
Interferometric optical profilometers are increasingly used for the characterization of the
static deformation of micromechanical devices and Micro (Opto) Electromechanical Systems …

Vibration Analysis at Microscale by Talbot Fringe Projection Method1

R Rodriguez‐Vera, K Genovese, JA Rayas… - Strain, 2009 - Wiley Online Library
This work focuses on the implementation of a structured light projection technique for the
analysis of the 3D vibration modes of microsamples. The Talbot image of a Ronchi grating is …

微结构特性的光学测试平台

胡晓东, 栗大超, 郭彤, 金翠云, 胡春光… - Acta Optica …, 2005 - opticsjournal.net
摘要微结构是微机电系统的基本元件, 其几何尺寸, 运动特性, 材料及力学特性直接影响微机电
系统的整体性能. 提出一种将计算机微视觉, 米劳显微干涉, 频闪成像和激光多普勒测振等技术 …

Micro-motion analyzer used for dynamic MEMS characterization

T Guo, H Chang, J Chen, X Fu, X Hu - Optics and lasers in Engineering, 2009 - Elsevier
A computer-controlled micro-motion analyzer (MMA) to study the dynamic behavior of
movable structures of MEMS is described in this paper. It employs two optical nondestructive …

Transient vibration imaging with time-resolved synthetic holographic confocal microscopy

M Schnell, PS Carney, R Hillenbrand - Optics Express, 2018 - opg.optica.org
We introduce a new modality for dynamic phase imaging in confocal microscopy based on
synthetic optical holography. By temporal demultiplexing of the detector signal into a series …