Trends in semiconductor defect engineering at the nanoscale
EG Seebauer, KW Noh - Materials Science and Engineering: R: Reports, 2010 - Elsevier
Defect engineering involves manipulating the type, concentration, spatial distribution, or
mobility of defects within a crystalline solid. Defect engineering in semiconductors has …
mobility of defects within a crystalline solid. Defect engineering in semiconductors has …
Effect of amorphization and carbon co-doping on activation and diffusion of boron in silicon
BJ Pawlak, T Janssens, B Brijs, W Vandervorst… - Applied physics …, 2006 - pubs.aip.org
We investigate the impact of amorphization and C co-implantation on B diffusion and
activation properties after conventional spike rapid thermal annealing (RTA). We observe …
activation properties after conventional spike rapid thermal annealing (RTA). We observe …
Suppression of phosphorus diffusion by carbon co-implantation
BJ Pawlak, R Duffy, T Janssens, W Vandervorst… - Applied physics …, 2006 - pubs.aip.org
The impact of Si interstitial (Si i) flux suppression on the formation of P junctions by rapid
thermal annealing (RTA) is demonstrated. Here we investigate the role of amorphization …
thermal annealing (RTA) is demonstrated. Here we investigate the role of amorphization …
Strong Isotopic Fractionation of Oxygen in TiO2 Obtained by Surface-Enhanced Solid-State Diffusion
H Jeong, EG Seebauer - The Journal of Physical Chemistry Letters, 2022 - ACS Publications
Isotopically pure semiconductors have important applications for cooling electronic devices
and quantum computing and sensing. Raw materials of sufficiently high isotopic purity are …
and quantum computing and sensing. Raw materials of sufficiently high isotopic purity are …
Effects of germanium and carbon coimplants on phosphorus diffusion in silicon
KC Ku, CF Nieh, J Gong, LP Huang, YM Sheu… - Applied physics …, 2006 - pubs.aip.org
The authors have studied the interactions between implant defects and phosphorus diffusion
in crystalline silicon. Defect engineering enables ultrashallow n+∕ p junction formation …
in crystalline silicon. Defect engineering enables ultrashallow n+∕ p junction formation …
Mechanism of creation and destruction of oxygen interstitial atoms by nonpolar zinc oxide (101 [combining macron] 0) surfaces
Oxygen vacancies (VO) influence many properties of ZnO in semiconductor devices, yet
synthesis methods leave behind variable and unpredictable VO concentrations. Oxygen …
synthesis methods leave behind variable and unpredictable VO concentrations. Oxygen …
Physical understanding of cryogenic implant benefits for electrical junction stability
F Adeni Khaja, B Colombeau, T Thanigaivelan… - Applied Physics …, 2012 - pubs.aip.org
We investigate the effect of cryogenic temperature implants on electrical junction stability for
ultra shallow junction applications for sub-32 nm technology nodes and beyond. A …
ultra shallow junction applications for sub-32 nm technology nodes and beyond. A …
Impact of carbon coimplantation on boron behavior in silicon: Carbon–boron coclustering and suppression of boron diffusion
Y Shimizu, H Takamizawa, K Inoue, T Toyama… - Applied Physics …, 2011 - pubs.aip.org
Coimplantation of heterogeneous dopants in materials can be used to control the principal
dopant distribution. We used atom probe tomography (APT) and secondary ion mass …
dopant distribution. We used atom probe tomography (APT) and secondary ion mass …
[图书][B] Leakage current and defect characterization of short channel MOSFETs
G Roll - 2012 - books.google.com
The continuous improvement in semiconductor technology requires field effect transistor
scaling while maintaining acceptable leakage currents. This study analyzes the effect of …
scaling while maintaining acceptable leakage currents. This study analyzes the effect of …
The formation of radiation damage in GaN during successive bombardment by light ions of various energies
AI Titov, PA Karaseov, KV Karabeshkin, AI Struchkov - Vacuum, 2020 - Elsevier
We present the results of investigation of radiation damage accumulation in GaN during its
sequential co-implantation with fluorine ions of two different energies. This process is proved …
sequential co-implantation with fluorine ions of two different energies. This process is proved …