The topographies of various surfaces have been studied in many fields due to the significant
influence that surfaces have on the practical performance of a given sample. A …

The aim of this study is to gain a deeper understanding of the micromorphology
characteristics of thin titanium nitride (TiN) films sputtered on glass substrates by using ion …

A bibliometric analysis of publications on fractal theory and thin films is presented in this
article. Bibliographic information is extracted from the Web of Science digital database and …

The micromorphology and semiconductor properties of TiO 2 thin films growth using different
ion beam energies have been finely analyzed using atomic force microscopy (AFM), ultra …

The purpose of this work is to study the dependence of AFM‐data reliability on scanning
rate. The three‐dimensional (3D) surface topography of the samples with different micro …

The micromorphology of tantalum pentoxide (Ta 2 O 5) thin films, deposited on glass
substrates by electron gun method, has been analyzed using atomic force microscopy …

The aim of this study was to report the first discussion of statistical parameters and possible
applications related to the surface of kefir biofilms prepared with Maytenus rigida Mart …

This work analyses the three‐dimensional (3‐D) surface texture of carbon–nickel (C–Ni)
films grown by radio frequency (RF) magnetron co‐sputtering on glass substrates. The C–Ni …

In this paper, we have successfully deposited Ag-Cu thin films. Nanoscale morphology and
nanotexture were studied using atomic force microscopy (AFM) through fractal and …

In this work, we developed new scripts to calculate the lacunarity exponent and Moran's
index of Atomic Force Microscopy (AFM) images. The lacunarity exponent was estimated by …