Investigation of the interface state characteristics of the Al/Al2O3/Ge/p-Si heterostructure over a wide frequency range by capacitance and conductance measurements
Abstract In this work, Al/Al 2 O 3/Ge/p-Si heterostructures were fabricated by e-beam thermal
evaporation. The EDX (energy dispersive X-ray spectroscopy) map visually obtained the …
evaporation. The EDX (energy dispersive X-ray spectroscopy) map visually obtained the …
Bridging the gap between surface physics and photonics
P Laukkanen, M Punkkinen, M Kuzmin… - Reports on Progress …, 2024 - iopscience.iop.org
Use and performance criteria of photonic devices increase in various application areas such
as information and communication, lighting, and photovoltaics. In many current and future …
as information and communication, lighting, and photovoltaics. In many current and future …
Passivation of III–V surfaces with crystalline oxidation
P Laukkanen, MPJ Punkkinen, M Kuzmin… - Applied Physics …, 2021 - pubs.aip.org
Control of interfacial physicochemical properties associated with device materials to
minimize the impact of point defects on device performance has been a dominant theme in …
minimize the impact of point defects on device performance has been a dominant theme in …
[HTML][HTML] A method for estimating defects in ferroelectric thin film MOSCAPs
We propose a capacitance measurement scheme that enables quantitative characterization
of ferroelectric thin films integrated on semiconductors. The film defect density is estimated …
of ferroelectric thin films integrated on semiconductors. The film defect density is estimated …
Hydrogen passivation of oxygen vacancies in LaAlO3
M Choi - Current Applied Physics, 2022 - Elsevier
Through first-principles calculation using the screened hybrid functional, we investigate the
energetics and electronic structure of substitutional hydrogen (HO) in which one hydrogen …
energetics and electronic structure of substitutional hydrogen (HO) in which one hydrogen …
A comprehensive gate and drain trapping/detrapping noise model and its implications for thin-dielectric MOSFETs
We derive a complete set of expressions for the MOSFET gate and drain power spectral
densities due to elastic and inelastic trapping/detrapping of channel carriers into the gate …
densities due to elastic and inelastic trapping/detrapping of channel carriers into the gate …
Fluorine and related complexes in α-Al2O3
M Choi, CG Van de Walle - Journal of Applied Physics, 2023 - pubs.aip.org
Using first-principles calculations based on hybrid-density-functional theory, we examine the
energetics and electronic structure of fluorine in α-Al 2 O 3. The F atom can be …
energetics and electronic structure of fluorine in α-Al 2 O 3. The F atom can be …
Evaluation of interface traps inside the conduction band of InAs-on-insulator nMOSFET by self-consistent Hall-QSCV method
Interface trap density (D it) inside the conduction band of (111)-oriented InAs-on-insulator
(InAs-OI) n-channel metal-oxide-semiconductor field-effect-transistor (nMOSFET) was …
(InAs-OI) n-channel metal-oxide-semiconductor field-effect-transistor (nMOSFET) was …
Effective passivation of p-and n-type In0. 53Ga0. 47As in achieving low leakage current, low interfacial traps, and low border traps
We have attained low leakage current, low interfacial traps, and low border traps by
effectively passivating both p-and n-In0. 53Ga0. 47As (InGaAs) surfaces using the same …
effectively passivating both p-and n-In0. 53Ga0. 47As (InGaAs) surfaces using the same …
Integration of ferroelectric hfo2 onto a iii-v nanowire platform
AEO Persson - 2023 - portal.research.lu.se
The discovery of ferroelectricity in CMOS-compatible oxides, such as doped hafnium oxide,
has opened new possibilities for electronics by reviving the use of ferroelectric …
has opened new possibilities for electronics by reviving the use of ferroelectric …