30 years of atomic force microscopy: creep, hysteresis, cross-coupling, and vibration problems of piezoelectric tube scanners
H Habibullah - Measurement, 2020 - Elsevier
This paper presents a brief history of scanning probe microscopes (SPMs) and a general
insight into an atomic force microscope (AFM), including its operating principles, modes …
insight into an atomic force microscope (AFM), including its operating principles, modes …
Performance of sinusoidal scanning with MPC in AFM imaging
An atomic force microscope (AFM) is an extremely versatile investigative tool in the field of
nanotechnology, the performance of which is significantly influenced by its conventional zig …
nanotechnology, the performance of which is significantly influenced by its conventional zig …
Improvement in the imaging performance of atomic force microscopy: A survey
Nanotechnology is the branch of science which deals with the manipulation of matters at an
extremely high resolution down to the atomic level. In recent years, atomic force microscopy …
extremely high resolution down to the atomic level. In recent years, atomic force microscopy …
A survey of methods used to control piezoelectric tube scanners in high‐speed AFM imaging
In most nanotechnology applications, speed and precision are important requirements for
obtaining good topographical maps of material surfaces using atomic force microscopes …
obtaining good topographical maps of material surfaces using atomic force microscopes …
Spiral scanning with improved control for faster imaging of AFM
One of the key barriers to an atomic force microscope (AFM) achieving high scanning
speeds is its use of the traditional zig-zag raster pattern scanning technique. In this paper …
speeds is its use of the traditional zig-zag raster pattern scanning technique. In this paper …
High-speed AFM image scanning using observer-based MPC-Notch control
This paper presents the design and experimental implementation of an observer-based
model predictive control scheme with a notch filter to achieve accurate tracking and fast …
model predictive control scheme with a notch filter to achieve accurate tracking and fast …
Effect of improved tracking for atomic force microscope on piezo nonlinear behavior
Nanotechnology is an area of modern science which deals with the control of matter at
dimensions of 100 nm or less. In recent years, of all the available microscopy techniques …
dimensions of 100 nm or less. In recent years, of all the available microscopy techniques …
A novel application of minimax LQG control technique for high‐speed spiral imaging
Over the last two decades, increasing the scanning speed of an atomic force microscopy
(AFM) has been attempted either by applying novel controllers, using alternative scanning …
(AFM) has been attempted either by applying novel controllers, using alternative scanning …
Cassini oval scanning for high-speed afm imaging
Atomic force microscopy (AFM) generally scans the sample surface following a raster pattern
signal, which contains discontinuities at turning points and frequencies beyond mechanical …
signal, which contains discontinuities at turning points and frequencies beyond mechanical …
A novel non-raster scan method for AFM imaging
N Nikooienejad, M Maroufi… - Dynamic Systems …, 2018 - asmedigitalcollection.asme.org
We report a new non-raster scan method based on a rosette pattern for high-speed atomic
force microscopy (AFM). In this method, the lateral axes of the scanner are driven by the sum …
force microscopy (AFM). In this method, the lateral axes of the scanner are driven by the sum …