This paper presents a brief history of scanning probe microscopes (SPMs) and a general
insight into an atomic force microscope (AFM), including its operating principles, modes …

An atomic force microscope (AFM) is an extremely versatile investigative tool in the field of
nanotechnology, the performance of which is significantly influenced by its conventional zig …

Nanotechnology is the branch of science which deals with the manipulation of matters at an
extremely high resolution down to the atomic level. In recent years, atomic force microscopy …

In most nanotechnology applications, speed and precision are important requirements for
obtaining good topographical maps of material surfaces using atomic force microscopes …

One of the key barriers to an atomic force microscope (AFM) achieving high scanning
speeds is its use of the traditional zig-zag raster pattern scanning technique. In this paper …

This paper presents the design and experimental implementation of an observer-based
model predictive control scheme with a notch filter to achieve accurate tracking and fast …

Nanotechnology is an area of modern science which deals with the control of matter at
dimensions of 100 nm or less. In recent years, of all the available microscopy techniques …

Over the last two decades, increasing the scanning speed of an atomic force microscopy
(AFM) has been attempted either by applying novel controllers, using alternative scanning …

Atomic force microscopy (AFM) generally scans the sample surface following a raster pattern
signal, which contains discontinuities at turning points and frequencies beyond mechanical …

We report a new non-raster scan method based on a rosette pattern for high-speed atomic
force microscopy (AFM). In this method, the lateral axes of the scanner are driven by the sum …