Offers a simple starting point to VPSEM, especially for new users, technicians and students
containing clear, concise explanations Crucially, the principles and applications outlined in …

A review, analysis and discussion on the derivation and measurement of electron scattering
cross-sections of gases mostly used in environmental scanning electron microscopy is …

A new approach has been initiated to improve the spatial lateral resolution of the X-ray
microanalysis and the backscattered electrons modes in variable pressure or environmental …

Gas impact on the EDS profile resolution at the interface of composite interface resin/Al was
investigated with two gaseous environments: helium and water vapor. Two main …

Early methods of microscopical imaging involved the use of lenses to focus and magnify the
pattern of light transmitted, refracted, or reflected by the specimen. Contrast in the final …

In variable pressure scanning electron microscopy (VPSEM) the current data suggests that
considerable caution is required in the interpretation of X-ray data from nonconductive …

Scattering of the incident electron beam in the variable pressure scanning electron
microscope (VPSEM) affects the ability to perform quantitative chemical measurements …

Polymer materials degradation is a well-known limitation to their characterization in SEM. In
this paper authors present an additional possibility for polymer imaging offered by the …

A validation of our recent new approach is presented here in order to better interpret the
EDS analysis results in low vacuum SEM. This approach is based on correlation between …

Environmental scanning electron microscopy (ESEM) with an energy‐dispersive X‐ray
spectrometer (EDS) and time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS) were …