The future transistors

W Cao, H Bu, M Vinet, M Cao, S Takagi, S Hwang… - Nature, 2023 - nature.com
The metal–oxide–semiconductor field-effect transistor (MOSFET), a core element of
complementary metal–oxide–semiconductor (CMOS) technology, represents one of the …

Ferroelectric field-effect transistors based on HfO2: a review

H Mulaosmanovic, ET Breyer, S Dünkel, S Beyer… - …, 2021 - iopscience.iop.org
In this article, we review the recent progress of ferroelectric field-effect transistors (FeFETs)
based on ferroelectric hafnium oxide (HfO 2), ten years after the first report on such a device …

Ferroelectric HfO2 Memory Transistors With High-κ Interfacial Layer and Write Endurance Exceeding 1010 Cycles

AJ Tan, YH Liao, LC Wang, N Shanker… - IEEE Electron …, 2021 - ieeexplore.ieee.org
We demonstrate ferroelectric (FE) memory transistors on a crystalline silicon channel with
endurance exceeding 10 10 cycles. The ferroelectric transistors (FeFETs) incorporate a high …

Defects in ferroelectric HfO 2

A Chouprik, D Negrov, EY Tsymbal, A Zenkevich - Nanoscale, 2021 - pubs.rsc.org
The discovery of ferroelectricity in polycrystalline thin films of doped HfO2 has reignited the
expectations of developing competitive ferroelectric non-volatile memory devices. To date, it …

Improved Ferroelectric/Semiconductor Interface Properties in Hf0.5Zr0.5O2 Ferroelectric FETs by Low-Temperature Annealing

K Toprasertpong, K Tahara, T Fukui… - IEEE Electron …, 2020 - ieeexplore.ieee.org
Crystallization annealing is a key process for the formation of the ferroelectric phase in HfO 2-
based ferroelectric thin films. In this study, we systematically investigate the notable tradeoff …

Memory window in ferroelectric field-effect transistors: Analytical approach

K Toprasertpong, M Takenaka… - IEEE Transactions on …, 2022 - ieeexplore.ieee.org
A memory window (MW) of ferroelectric field-effect transistors (FeFETs), defined as a
separation of the HIGH-state and the LOW-state threshold voltages, is an important measure …

Reconfigurable Physical Reservoir in GaN/α-In2Se3 HEMTs Enabled by Out-of-Plane Local Polarization of Ferroelectric 2D Layer

JY Yang, M Park, MJ Yeom, Y Baek, SC Yoon… - ACS …, 2023 - ACS Publications
Significant effort for demonstrating a gallium nitride (GaN)-based ferroelectric metal–oxide–
semiconductor (MOS)-high-electron-mobility transistor (HEMT) for reconfigurable operation …

Wakeup-free and endurance-robust ferroelectric field-effect transistor memory using high pressure annealing

MC Nguyen, S Kim, K Lee, JY Yim… - IEEE Electron Device …, 2021 - ieeexplore.ieee.org
Wakeup-free and endurance-robust HfZrO 2 (HZO) ferroelectric field-effect transistor
(FeFET) was fabricated on a silicon-on-insulator substrate. After a high-pressure forming gas …

Reliability of HfO2-Based Ferroelectric FETs: A Critical Review of Current and Future Challenges

N Zagni, FM Puglisi, P Pavan… - Proceedings of the …, 2023 - ieeexplore.ieee.org
Ferroelectric transistors (FeFETs) based on doped hafnium oxide (HfO2) have received
much attention due to their technological potential in terms of scalability, high-speed, and …

Dielectric-engineered high-speed, low-power, highly reliable charge trap flash-based synaptic device for neuromorphic computing beyond inference

JP Kim, SK Kim, S Park, S Kuk, T Kim, BH Kim… - Nano Letters, 2023 - ACS Publications
The coming of the big-data era brought a need for power-efficient computing that cannot be
realized in the Von Neumann architecture. Neuromorphic computing which is motivated by …