Short-Wave Infrared Upconverting Nanoparticles

X Qi, C Lee, B Ursprung, A Skripka… - Journal of the …, 2024 - ACS Publications
Optical technologies enable real-time, noninvasive analysis of complex systems but are
limited to discrete regions of the optical spectrum. While wavelengths in the short-wave …

[HTML][HTML] Introduction to electron ptychography for materials scientists

R Yu, H Sha, J Cui, W Yang - Microstructures, 2024 - oaepublish.com
Even when aberration-corrected electron microscopy is in the ascendant, the microstructural
analysis of materials faces the problems of residual aberrations, zone-axis deviation, surface …

Iterative phase retrieval algorithms for scanning transmission electron microscopy

G Varnavides, SM Ribet, SE Zeltmann, Y Yu… - arXiv preprint arXiv …, 2023 - arxiv.org
Scanning transmission electron microscopy (STEM) has been extensively used for imaging
complex materials down to atomic resolution. The most commonly employed STEM …

Polar vortex hidden in twisted bilayers of paraelectric SrTiO3

H Sha, Y Zhang, Y Ma, W Li, W Yang, J Cui, Q Li… - Nature …, 2024 - nature.com
Polar topologies, such as vortex and skyrmion, have attracted significant interest due to their
unique physical properties and promising applications in high-density memory devices. To …

Streaming Large-Scale Electron Microscopy Data to a Supercomputing Facility

SS Welborn, C Harris, SM Ribet, G Varnavides… - arXiv preprint arXiv …, 2024 - arxiv.org
Data management is a critical component of modern experimental workflows. As data
generation rates increase, transferring data from acquisition servers to processing servers …

Streaming Large-Scale Microscopy Data to a Supercomputing Facility

SS Welborn, C Harris, SM Ribet… - Microscopy and …, 2024 - academic.oup.com
Data management is a critical component of modern experimental workflows. As data
generation rates increase, transferring data from acquisition servers to processing servers …

Ultra-fast Digital DPC Yielding High Spatio-temporal Resolution for Low-Dose Phase Characterization

JM Bekkevold, JJP Peters, R Ishikawa… - Microscopy and …, 2024 - academic.oup.com
In the scanning transmission electron microscope, both phase imaging of beam-sensitive
materials and characterization of a material's functional properties using in situ experiments …

Unraveling the Myths and Mysteries of Photon Avalanching Nanoparticles

A Skripka, E Chan - 2024 - chemrxiv.org
Photon avalanching (PA) nanomaterials exhibit some of the most nonlinear optical
phenomena reported for any material, allowing them to push the frontiers of applications …