Oxygen defect processes in silicon and silicon germanium
A Chroneos, EN Sgourou, CA Londos… - Applied Physics …, 2015 - pubs.aip.org
Silicon and silicon germanium are the archetypical elemental and alloy semiconductor
materials for nanoelectronic, sensor, and photovoltaic applications. The investigation of …
materials for nanoelectronic, sensor, and photovoltaic applications. The investigation of …
Toward defect engineering strategies to optimize energy and electronic materials
The technological requirement to optimize materials for energy and electronic materials has
led to the use of defect engineering strategies. These strategies take advantage of the …
led to the use of defect engineering strategies. These strategies take advantage of the …
Ge interface engineering using ultra-thin La2O3 and Y2O3 films: A study into the effect of deposition temperature
IZ Mitrovic, M Althobaiti, AD Weerakkody… - Journal of Applied …, 2014 - pubs.aip.org
A study into the optimal deposition temperature for ultra-thin La 2 O 3/Ge and Y 2 O 3/Ge
gate stacks has been conducted in this paper with the aim to tailor the interfacial layer for …
gate stacks has been conducted in this paper with the aim to tailor the interfacial layer for …
Atomic and electronic structure of the ferroelectric BaTiO3/Ge (001) interface
In this study, we demonstrate the epitaxial growth of BaTiO 3 on Ge (001) by molecular
beam epitaxy using a thin Zintl template buffer layer. A combination of density functional …
beam epitaxy using a thin Zintl template buffer layer. A combination of density functional …
Impurity diffusion, point defect engineering, and surface/interface passivation in germanium
A Chroneos, U Schwingenschlögl… - Annalen der …, 2012 - Wiley Online Library
In recent years germanium has been emerging as a mainstream material that could have
important applications in the microelectronics industry. The principle aim of this study is to …
important applications in the microelectronics industry. The principle aim of this study is to …
Electrical properties of HfO2/La2O3 gate dielectrics on Ge with ultrathin nitride interfacial layer formed by in situ N2/H2/Ar radical pretreatment
MH Lin, CK Lan, CC Chen, JY Wu - Applied Physics Letters, 2011 - pubs.aip.org
In situ N 2/H 2/Ar radical pretreatment on p-type Ge (100) with HfO 2/La 2 O 3 high-κ gate
oxide was investigated by remote rf plasma on radical-assisted atomic layer deposition. The …
oxide was investigated by remote rf plasma on radical-assisted atomic layer deposition. The …
Effect of carbon on dopant–vacancy pair stability in germanium
A Chroneos - Semiconductor science and technology, 2011 - iopscience.iop.org
Density functional theory calculations were used to study the interaction between carbon
and isolated substitutional dopants (boron, gallium, aluminium, indium, silicon, tin, nitrogen …
and isolated substitutional dopants (boron, gallium, aluminium, indium, silicon, tin, nitrogen …
Defect configurations of high-k cations in germanium
A Chroneos, A Dimoulas - Journal of Applied Physics, 2012 - pubs.aip.org
At germanium/high-k interfaces cations and oxygen interstitials can diffuse into the
germanium substrate. Here we employ density functional theory calculations to investigate …
germanium substrate. Here we employ density functional theory calculations to investigate …
Using Ge-doped La-Oxynitride as interfacial passivation layer for GaAs metal-oxide-semiconductor capacitors
HH Lu, JP Xu, L Liu - IEEE Transactions on Device and …, 2016 - ieeexplore.ieee.org
The GaAs MOS capacitors using ZrON as high-k gate dielectric with LaGeON or LaON as an
interfacial passivation layer (IPL) are fabricated and their electrical and interfacial properties …
interfacial passivation layer (IPL) are fabricated and their electrical and interfacial properties …
[HTML][HTML] Impact of oxidation and reduction annealing on the electrical properties of Ge/La2O3/ZrO2 gate stacks
C Henkel, PE Hellström, M Östling… - Solid-state …, 2012 - Elsevier
The paper addresses the passivation of Germanium surfaces by using layered La2O3/ZrO2
high-k dielectrics deposited by Atomic Layer Deposition to be applied in Ge-based MOSFET …
high-k dielectrics deposited by Atomic Layer Deposition to be applied in Ge-based MOSFET …