Oxygen defect processes in silicon and silicon germanium

A Chroneos, EN Sgourou, CA Londos… - Applied Physics …, 2015 - pubs.aip.org
Silicon and silicon germanium are the archetypical elemental and alloy semiconductor
materials for nanoelectronic, sensor, and photovoltaic applications. The investigation of …

Toward defect engineering strategies to optimize energy and electronic materials

EN Sgourou, Y Panayiotatos, RV Vovk, A Chroneos - Applied Sciences, 2017 - mdpi.com
The technological requirement to optimize materials for energy and electronic materials has
led to the use of defect engineering strategies. These strategies take advantage of the …

Ge interface engineering using ultra-thin La2O3 and Y2O3 films: A study into the effect of deposition temperature

IZ Mitrovic, M Althobaiti, AD Weerakkody… - Journal of Applied …, 2014 - pubs.aip.org
A study into the optimal deposition temperature for ultra-thin La 2 O 3/Ge and Y 2 O 3/Ge
gate stacks has been conducted in this paper with the aim to tailor the interfacial layer for …

Atomic and electronic structure of the ferroelectric BaTiO3/Ge (001) interface

KD Fredrickson, P Ponath, AB Posadas… - Applied Physics …, 2014 - pubs.aip.org
In this study, we demonstrate the epitaxial growth of BaTiO 3 on Ge (001) by molecular
beam epitaxy using a thin Zintl template buffer layer. A combination of density functional …

Impurity diffusion, point defect engineering, and surface/interface passivation in germanium

A Chroneos, U Schwingenschlögl… - Annalen der …, 2012 - Wiley Online Library
In recent years germanium has been emerging as a mainstream material that could have
important applications in the microelectronics industry. The principle aim of this study is to …

Electrical properties of HfO2/La2O3 gate dielectrics on Ge with ultrathin nitride interfacial layer formed by in situ N2/H2/Ar radical pretreatment

MH Lin, CK Lan, CC Chen, JY Wu - Applied Physics Letters, 2011 - pubs.aip.org
In situ N 2/H 2/Ar radical pretreatment on p-type Ge (100) with HfO 2/La 2 O 3 high-κ gate
oxide was investigated by remote rf plasma on radical-assisted atomic layer deposition. The …

Effect of carbon on dopant–vacancy pair stability in germanium

A Chroneos - Semiconductor science and technology, 2011 - iopscience.iop.org
Density functional theory calculations were used to study the interaction between carbon
and isolated substitutional dopants (boron, gallium, aluminium, indium, silicon, tin, nitrogen …

Defect configurations of high-k cations in germanium

A Chroneos, A Dimoulas - Journal of Applied Physics, 2012 - pubs.aip.org
At germanium/high-k interfaces cations and oxygen interstitials can diffuse into the
germanium substrate. Here we employ density functional theory calculations to investigate …

Using Ge-doped La-Oxynitride as interfacial passivation layer for GaAs metal-oxide-semiconductor capacitors

HH Lu, JP Xu, L Liu - IEEE Transactions on Device and …, 2016 - ieeexplore.ieee.org
The GaAs MOS capacitors using ZrON as high-k gate dielectric with LaGeON or LaON as an
interfacial passivation layer (IPL) are fabricated and their electrical and interfacial properties …

[HTML][HTML] Impact of oxidation and reduction annealing on the electrical properties of Ge/La2O3/ZrO2 gate stacks

C Henkel, PE Hellström, M Östling… - Solid-state …, 2012 - Elsevier
The paper addresses the passivation of Germanium surfaces by using layered La2O3/ZrO2
high-k dielectrics deposited by Atomic Layer Deposition to be applied in Ge-based MOSFET …