Roadmap on ferroelectric hafnia-and zirconia-based materials and devices

JPB Silva, R Alcala, UE Avci, N Barrett, L Bégon-Lours… - APL Materials, 2023 - pubs.aip.org
Ferroelectric hafnium and zirconium oxides have undergone rapid scientific development
over the last decade, pushing them to the forefront of ultralow-power electronic systems …

A Perspective on ferroelectricity in hafnium oxide: Mechanisms and considerations regarding its stability and performance

JF Ihlefeld, ST Jaszewski, SS Fields - Applied Physics Letters, 2022 - pubs.aip.org
Ferroelectric hafnium oxides are poised to impact a wide range of microelectronic
applications owing to their superior thickness scaling of ferroelectric stability and …

Retention Improvement of HZO-Based Ferroelectric Capacitors with TiO2 Insets

AA Koroleva, AG Chernikova, SS Zarubin… - ACS …, 2022 - ACS Publications
The influence of the bottom TiO2 interfacial layer grown by atomic layer deposition on the
ferroelectric properties of the TiN/Hf0. 5Zr0. 5O2/TiN capacitors is systematically …

Impact of Oxygen Vacancy on Ferroelectric Characteristics and Its Implication for Wake-Up and Fatigue of HfO2-Based Thin Films

J Chen, C Jin, X Yu, X Jia, Y Peng, Y Liu… - … on Electron Devices, 2022 - ieeexplore.ieee.org
In this article, a phase-field polarization switching model for ferroelectric HfO 2-based thin
films considering oxygen vacancies () has been developed based on the 2-D time …

Electronic Synapses Enabled by an Epitaxial SrTiO3‐δ / Hf0.5Zr0.5O2 Ferroelectric Field‐Effect Memristor Integrated on Silicon

N Siannas, C Zacharaki, P Tsipas… - Advanced Functional …, 2024 - Wiley Online Library
Synapses play a vital role in information processing, learning, and memory formation in the
brain. By emulating the behavior of biological synapses, electronic synaptic devices hold the …

Mitigation of field-driven dynamic phase evolution in ferroelectric Hf0. 5Zr0. 5O2 films by adopting oxygen-supplying electrode

Y Lee, SH Kim, HW Jeong, GH Park, J Lee… - Applied Surface …, 2024 - Elsevier
Abstract Ferroelectricity in (Hf, Zr) O 2 films under 10 nm has been correlated with various
factors, including dopant, oxygen deficiency, strain, and surface energy. Owing to their …

Evaluation of Imprint and Multi‐Level Dynamics in Ferroelectric Capacitors

S Vecchi, FM Puglisi, P Appelt, R Guido… - Advanced Electronic …, 2024 - Wiley Online Library
Fluorite‐structured ferroelectrics are one of the most promising material systems for
emerging memory technologies. However, when integrated into electronic devices, these …

[HTML][HTML] Oxygen vacancy contributions to the electrical stress response and endurance of ferroelectric hafnium zirconium oxide thin films

A Mallick, MK Lenox, TE Beechem, JF Ihlefeld… - Applied Physics …, 2023 - pubs.aip.org
Despite its scalability and CMOS process compatibility, the limited endurance and sub-
optimal stress response of ferroelectric Zr-substituted hafnia [(Hf, Zr) O 2] have been one of …

Improved Polarization‐Retention‐Endurance in Hf0.5Zr0.5O2 Films by ZrO2 Capping via Electrostatic Effects

T Song, P Koutsogiannis, C Magén… - Advanced Electronic …, 2024 - Wiley Online Library
Ferroelectric hafnia is one of the most promising materials for next generation of non‐volatile
memory devices. Several strategies have demonstrated to be of interest to improve its …

Oxygen Vacancies as Traps Responsible for La-Doped Hf0.5Zr0.5O2 Charge Transport

TV Perevalov, AA Gismatulin, IP Prosvirin… - The Journal of …, 2023 - ACS Publications
In the current study, a number of experimental methods combined with ab initio simulations
and charge transport simulations were used to prove that oxygen vacancies are responsible …