DeepThink IoT: the strength of deep learning in internet of things

D Thakur, JK Saini, S Srinivasan - Artificial Intelligence Review, 2023 - Springer
Abstract The integration of Deep Learning (DL) and the Internet of Things (IoT) has
revolutionized technology in the twenty-first century, enabling humans and machines to …

A review of GaN HEMT dynamic ON-Resistance and dynamic stress effects on field distribution

L Gill, S DasGupta, J Neely, R Kaplar… - IEEE Transactions on …, 2023 - ieeexplore.ieee.org
Gallium nitride (GaN) is an emerging wide-bandgap material with superior physical
characteristics, including critical electric field, electron mobility, and specific on-resistance …

Design procedure and efficiency analysis of a 99.3% efficient 10 kW three-phase three-level hybrid GaN/Si active neutral point clamped converter

M Najjar, A Kouchaki, J Nielsen… - … on Power Electronics, 2021 - ieeexplore.ieee.org
High-efficient and power-dense ac–dc power electronic converters are demanded for a wide
range of applications, such as motor drives and active rectifiers. The utilization of wide …

Design of magnetic structure for omnidirectional wireless power transfer

HR Cha, KR Park, TJ Kim… - IEEE Transactions on …, 2021 - ieeexplore.ieee.org
Recently, an omnidirectional wireless power transfer (WPT) has attracted attention as a
solution to the limitations of free-positioning and mobility of conventional WPT. However, the …

Comparison investigations on unclamped-inductive-switching behaviors of power GaN switching devices

S Li, S Liu, C Zhang, L Qian, S Xin… - IEEE Transactions on …, 2021 - ieeexplore.ieee.org
This article makes the comparisons on the behaviors of three types of commercial GaN
power switching devices, including Schottky gate p-GaN high electron mobility transistor …

In-situ calibration method of online junction temperature estimation in IGBTs for electric vehicle drives

W Lai, Y Wei, M Chen, H Xia, D Luo, H Li… - … on Power Electronics, 2022 - ieeexplore.ieee.org
Junction temperature is the most important factor to induce the insulated gate bipolar
transistor module failure and conduct operational management. In-situ calibrated method …

Comparative evaluation of three-phase three-level GaN and seven-level Si flying capacitor inverters for integrated motor drives considering overload operation

G Rohner, T Gfrörer, PS Niklaus, D Bortis… - IEEE …, 2024 - ieeexplore.ieee.org
Integrated Motor Drives (IMDs) are gaining popularity in industrial Variable Speed Drive
(VSD) applications, thanks to their more compact realization and simpler installation …

A comparison of the hard-switching performance of 650V power transistors with calorimetric verification

DJ Rogers, J Bruford, A Ristic-Smith… - IEEE Open Journal …, 2023 - ieeexplore.ieee.org
We compare the switching losses of four equivalent silicon and wide-bandgap 650 V power
transistors operated in a hard-switched half-bridge configuration, switching 400 V at 40 A …

H-bridge derived topology for dynamic on-resistance evaluation in power GaN HEMTs

R Kumar, A Sarkar, S Anand… - IEEE Transactions on …, 2022 - ieeexplore.ieee.org
Gallium nitride high electron mobility transistors outperform Silicon devices due to their
excellent physical properties. However, being an immature technology, it exhibits dynamic …

A postprocessing-technique-based switching loss estimation method for GaN devices

M Dong, H Li, S Yin, Y Wu… - IEEE Transactions on …, 2020 - ieeexplore.ieee.org
Gallium nitride (GaN) high electron mobility transistor (HEMT) is a promising candidate for
the high-density power converter applications. Due to the low switching loss, the GaN HEMT …