The use of synchrotron radiation techniques in the characterization of strained semiconductor heterostructures and thin films
C Lamberti - Surface Science Reports, 2004 - Elsevier
In the last couple of decades, high-performance electronic and optoelectronic devices based
on semiconductor heterostructures have been required to obtain increasingly strict and well …
on semiconductor heterostructures have been required to obtain increasingly strict and well …
Compound semiconductor alloys: From atomic-scale structure to bandgap bowing
CS Schnohr - Applied physics reviews, 2015 - pubs.aip.org
Compound semiconductor alloys such as In x Ga 1− x As, GaAs x P 1− x, or CuIn x Ga 1− x
Se 2 are increasingly employed in numerous electronic, optoelectronic, and photonic …
Se 2 are increasingly employed in numerous electronic, optoelectronic, and photonic …
Re-examination of the SiGe Raman spectra: Percolation/one-dimensional-cluster scheme and ab initio calculations
O Pagès, J Souhabi, VJB Torres, AV Postnikov… - Physical Review B …, 2012 - APS
We report on the detailed assignment of various features observed in the Raman spectra of
SiGe alloys along the linear chain approximation (LCA), as achieved based on remarkable …
SiGe alloys along the linear chain approximation (LCA), as achieved based on remarkable …
Extended X-ray absorption fine structure investigation of Sn local environment in strained and relaxed epitaxial Ge1− xSnx films
F Gencarelli, D Grandjean, Y Shimura… - Journal of Applied …, 2015 - pubs.aip.org
We present an extended X-ray absorption fine structure investigation of the local
environment of Sn atoms in strained and relaxed Ge1ÀxSnx layers with different …
environment of Sn atoms in strained and relaxed Ge1ÀxSnx layers with different …
Self-diffusion of 71Ge and 31Si in Si –Ge alloys
A Strohm, T Voss, W Frank, P Laitinen… - International Journal of …, 2021 - degruyter.com
The tracer self-diffusion coefficients DT of implanted 71Ge and 31Si in both relaxed
monocrystalline SiyGe1–y epilayers and specimens made from bulk SiyGe1–y have been …
monocrystalline SiyGe1–y epilayers and specimens made from bulk SiyGe1–y have been …
Molecular dynamics study of structural and dynamical properties of amorphous Si-Ge alloys
M Ishimaru, M Yamaguchi, Y Hirotsu - Physical Review B, 2003 - APS
Structural and dynamical properties of amorphous silicon-germanium (a− Si 1− x Ge x)
alloys have been examined by molecular dynamics simulations using the Tersoff interatomic …
alloys have been examined by molecular dynamics simulations using the Tersoff interatomic …
Excitation Energies and Radiative Lifetimes of Nanocrystals: <?format ?>Alloying Versus Confinement Effects
HC Weissker, J Furthmüller, F Bechstedt - Physical review letters, 2003 - APS
The composition dependence of the optical and structural properties of G e 1-x S ix
nanocrystals is investigated by means of ab initio total-energy and electronic-structure …
nanocrystals is investigated by means of ab initio total-energy and electronic-structure …
Structural and optical properties of amorphous and crystalline GeSn layers on Si
RR Lieten, C Fleischmann, S Peters… - ECS Journal of Solid …, 2014 - iopscience.iop.org
We have investigated the structural and optical properties of metastable amorphous and
crystalline GeSn layers on Si substrates. The as-deposited amorphous layers crystallize …
crystalline GeSn layers on Si substrates. The as-deposited amorphous layers crystallize …
Extended x-ray absorption fine structure study of porous GaSb formed by ion implantation
Porous GaSb has been formed by Ga ion implantation into crystalline GaSb substrates at
either room temperature or− 180 C. The morphology has been characterized using scanning …
either room temperature or− 180 C. The morphology has been characterized using scanning …
Formation, structure, and phonon confinement effect of nanocrystalline Si1− xGex in SiO2‐Si‐Ge cosputtered films
YM Yang, XL Wu, GG Siu, GS Huang… - Journal of applied …, 2004 - pubs.aip.org
Using magnetron cosputtering of Si O 2, Ge, and Si targets, Si-based Si O 2: Ge: Si films
were fabricated for exploring the influence of Si target proportion (P Si) and annealing …
were fabricated for exploring the influence of Si target proportion (P Si) and annealing …