Micro/nanoscale 3D assembly by rolling, folding, curving, and buckling approaches

X Cheng, Y Zhang - Advanced Materials, 2019 - Wiley Online Library
The miniaturization of electronics has been an important topic of study for several decades.
The established roadmaps following Moore's Law have encountered bottlenecks in recent …

A review of recent research on heat transfer in three-dimensional integrated circuits (3-D ICs)

SS Salvi, A Jain - IEEE Transactions on Components …, 2021 - ieeexplore.ieee.org
Three-dimensional integrated circuits (3-D IC) technology has emerged in the past few
decades, driven in part by the techno-economic difficulties of dimensional scaling and the …

A survey on chip to system reverse engineering

SE Quadir, J Chen, D Forte, N Asadizanjani… - ACM journal on …, 2016 - dl.acm.org
The reverse engineering (RE) of electronic chips and systems can be used with honest and
dishonest intentions. To inhibit RE for those with dishonest intentions (eg, piracy and …

GRIM-Filter: Fast seed location filtering in DNA read mapping using processing-in-memory technologies

JS Kim, D Senol Cali, H Xin, D Lee, S Ghose, M Alser… - BMC genomics, 2018 - Springer
Background Seed location filtering is critical in DNA read mapping, a process where billions
of DNA fragments (reads) sampled from a donor are mapped onto a reference genome to …

A survey of optimization techniques for thermal-aware 3D processors

K Cao, J Zhou, T Wei, M Chen, S Hu, K Li - Journal of Systems Architecture, 2019 - Elsevier
Interconnect scaling has become a major design challenge for traditional planar (2D)
integrated circuits (ICs). Three-dimensional (3D) IC that stacks multiple device layers …

TSV stress-aware full-chip mechanical reliability analysis and optimization for 3D IC

M Jung, J Mitra, DZ Pan, SK Lim - Communications of the ACM, 2014 - dl.acm.org
Three-dimensional integrated circuit (3D IC) with through-silicon-via (TSV) is believed to
offer new levels of efficiency, power, performance, and form-factor advantages over the …

TSV-aware analytical placement for 3D IC designs

MK Hsu, YW Chang, V Balabanov - Proceedings of the 48th Design …, 2011 - dl.acm.org
Through-silicon vias (TSVs) are required for transmitting signals among different dies for the
three-dimensional integrated circuit (3D IC) technology. The significant silicon areas …

A design tradeoff study with monolithic 3D integration

C Liu, SK Lim - Thirteenth International Symposium on Quality …, 2012 - ieeexplore.ieee.org
This paper studies various design tradeoffs existing in the monolithic 3D integration
technology. Different design styles in monolithic 3D ICs are studied, including transistor …

SunFloor 3D: A tool for networks on chip topology synthesis for 3-D systems on chips

C Seiculescu, S Murali, L Benini… - IEEE Transactions on …, 2010 - ieeexplore.ieee.org
Three-dimensional integrated circuits (3D-ICs) are a promising approach to address the
integration challenges faced by current systems on chips (SoCs). Designing an efficient …

Full-chip TSV-to-TSV coupling analysis and optimization in 3D IC

C Liu, T Song, J Cho, J Kim, J Kim, SK Lim - Proceedings of the 48th …, 2011 - dl.acm.org
This paper studies TSV-to-TSV coupling in 3D ICs. A full-chip SI analysis flow is proposed
based on the proposed coupling model. Analysis results show that TSVs cause significant …