[PDF][PDF] Design and simulate a doherty power amplifier using GaAs technology for telecommunication applications
E Barmala - Indonesian Journal of Electrical Engineering …, 2019 - pdfs.semanticscholar.org
In this paper, a Doherty power amplifier was designed and simulated at 2.4 GHz central
frequency which has high efficiency. A Doherty power amplifier is a way to increase the …
frequency which has high efficiency. A Doherty power amplifier is a way to increase the …
[PDF][PDF] Design of very low-voltages and high-performance CMOS gate-driven operational amplifier
HK Al-Qaysi, MM Jasim… - Indonesian Journal of …, 2020 - researchgate.net
This paper presents the description and analysis of the design and HSPICE-based
simulation results of very low-voltages (LVs) power supplies and highperformance …
simulation results of very low-voltages (LVs) power supplies and highperformance …
Research on chip test method for improving test quality
H Yan, X Feng, Y Hu, X Tang - 2019 IEEE 2nd International …, 2019 - ieeexplore.ieee.org
As the integration level of chip increases, the mass testing after wafer fabrication has
become more and more complex. How to improve the quality of chip testing has become an …
become more and more complex. How to improve the quality of chip testing has become an …
[PDF][PDF] Fault Coverage Improvement of CMOS Analog Circuits Using Supply Current Testing Method
In this paper, a testing technique based on supply cur-rent verifying is presented, for fault
detection of analog circuits containing CMOS operational amplifiers. This testing technique …
detection of analog circuits containing CMOS operational amplifiers. This testing technique …
[PDF][PDF] Wide tuning multimode split-load ring oscillator for leakage-tolerant stuck-on fault detection in submicron CMOS circuits
SM Ishraqul Huq - 2021 - lib.buet.ac.bd
This thesis focuses on designing robust and reliable fault testing methods using oscillators
to detect transistor stuck-on (TSON) faults in submicron CMOS circuits. Simulations are …
to detect transistor stuck-on (TSON) faults in submicron CMOS circuits. Simulations are …
Stuck-at Fault Resilience using Redundant Transistor Logic Gates
R McWilliam, P Schiefer, A Purvis… - 2019 IEEE Intl Conf on …, 2019 - ieeexplore.ieee.org
The paper demonstrates a novel design for a stuck-at CMOS gate based on dual-purpose
redundancy. It combines detection and mitigation against common stuck-at fault conditions …
redundancy. It combines detection and mitigation against common stuck-at fault conditions …
Study on Battery-less Signal Conditioner for a Biological Signal Measurement System Using Smartphone
宮内亮一, ミヤウチリョウイチ - 2019 - miyazaki-u.repo.nii.ac.jp
In recent years, improving the quality of life and increasing the healthy life expectancy are
becoming global concern and challenges. For this reason, management of health on a daily …
becoming global concern and challenges. For this reason, management of health on a daily …