Switching Transient Based Junction Temperature Estimation of SiC MOSFETs With Aging Compensation

M Farhadi, R Sajadi… - IEEE Transactions on …, 2024 - ieeexplore.ieee.org
This article puts forward a novel online method to measure the junction temperature () of SiC
MOSFETs. In this method, the voltage spikes in the common source stray inductance are …