Cathodoluminescence (CL) studies are widely applied in semi‐conductor science and
technology. However, for structures with ap‐n junction the CL spatial distribution can be …

The dependence of defect detection by cathodoluminescence in a scanning electron
microscope on the electron beam current is considered. The examined specimens are …

Cathodoluminescence (CL) in scanning electron microscopy (SEM) is commonly accepted
as revealing local properties of a specimen region illuminated by an electron beam. CL is …

Spatially and spectrally resolved cathodoluminescence (CL) studies performed in a
scanning electron microscope (SEM) or a scanning transmission electron microscope …

The dependence of spatially and spectrally resolved cathodoluminescence in a scanning
electron microscope on resistances in semiconductor structures, especially on the layer …

Cathodoluminescence and photoluminescence measurements are commonly accepted as
revealing local properties of a specimen region excited by a beam of electrons or photons …

Luminescence studies are used to investigate the local properties of various light-emitting
materials. A critical issue of these studies is presented that the signals often lack all …

Various branches of applied physics use luminescence based methods to investigate light-
emitting specimens with high spatial resolution. A key problem is that luminescence signals …